Adam P Wax, Age 54209 Maywood Way, Chapel Hill, NC 27516

6847456, Jan 25, 2005

Apr 27, 2001

09/844286

Changhuei Yang - Cambridge MA, US
Adam P. Wax - Boston MA, US
Lev T. Perelman - Brookline MA, US
Ramachandra R. Dasari - Lexington MA, US
Michael S. Feld - Newton MA, US

Massachusetts Institute of Technology - Cambridge MA

G01B 902

356489, 356511

The present invention relates to systems and methods of field-based light scattering spectroscopy. These systems and methods provide for the diagnosis of tissue by measuring the size and distribution of cellular characteristics. Field based measurements provide phase information resulting from the interaction of scatterers within the material and the incident wavefront. These measurements can be used to provide three dimensional images of tissue.

6934035, Aug 23, 2005

Dec 18, 2001

10/024455

Changhuei Yang - Singapore, SG
Adam Wax - Boston MA, US
Ramachandra R. Dasari - Lexington MA, US
Michael S. Feld - Newton MA, US

Massachusetts Institute of Technology - Cambridge MA

G01B009/02

356485, 356486, 356497

The methods of the present invention are directed at an accurate phase-based technique for measuring arbitrarily long optical distances with sub-nanometer precision. A preferred embodiment of the present invention method employs a interferometer, for example, a Michelson interferometer, with a pair of harmonically related light sources, one continuous wave (CW) and a second source having low coherence. By slightly adjusting the center wavelength of the low coherence source between scans of the target sample, the phase relationship between the heterodyne signals of the CW and low coherence light is used to measure the separation between reflecting interfaces with sub-nanometer precision. As the preferred embodiment of this method is completely free of 2π ambiguity, an issue that plagues most phase-based techniques, it can be used to measure arbitrarily long optical distances without loss of precision.

7102758, Sep 5, 2006

May 6, 2003

10/429756

Adam Wax - Chapel Hill NC, US

Duke University - Durham NC

G01B 9/02

356497

An apparatus and method for obtaining depth-resolved spectra for the purpose of determining the size of scatterers by measuring their elastic scattering properties. Depth resolution is achieved by using a white light source in a Michelson interferometer and dispersing a mixed signal and reference fields. The measured spectrum is Fourier transformed to obtain an axial spatial cross-correlation between the signal and reference fields with near 1 μm depth-resolution. The spectral dependence of scattering by the sample is determined by windowing the spectrum to measure the scattering amplitude as a function of wavenumber.

7365858, Apr 29, 2008

Apr 13, 2004

10/823389

Christopher M. Fang-Yen - Somerville MA, US
Gabriel Popescu - Brighton MA, US
Changhuei Yang - Pasadena CA, US
Adam Wax - Chapel Hill NC, US
Ramachandra R. Dasari - Lexington MA, US
Michael S. Feld - Newton MA, US

Massachusetts Institute of Technology - Cambridge MA

G01B 9/02
G01B 11/02

356489, 356512

Preferred embodiments of the present invention are directed to systems for phase measurement which address the problem of phase noise using combinations of a number of strategies including, but not limited to, common-path interferometry, phase referencing, active stabilization and differential measurement. Embodiment are directed to optical devices for imaging small biological objects with light. These embodiments can be applied to the fields of, for example, cellular physiology and neuroscience. These preferred embodiments are based on principles of phase measurements and imaging technologies. The scientific motivation for using phase measurements and imaging technologies is derived from, for example, cellular biology at the sub-micron level which can include, without limitation, imaging origins of dysplasia, cellular communication, neuronal transmission and implementation of the genetic code. The structure and dynamics of sub-cellular constituents cannot be currently studied in their native state using the existing methods and technologies including, for example, x-ray and neutron scattering. In contrast, light based techniques with nanometer resolution enable the cellular machinery to be studied in its native state.

7557929, Jul 7, 2009

Jun 18, 2004

10/871610

Christopher M. Fang-Yen - Somerville MA, US
Gabriel Popescu - Brighton MA, US
Changhuei Yang - Pasadena CA, US
Adam Wax - Chapel Hill NC, US
Ramachandra R. Dasari - Lexington MA, US
Michael S. Feld - Newton MA, US

Massachusetts Institute of Technology - Cambridge MA

G01B 9/02
G01B 11/02

356484, 356497

Preferred embodiments of the present invention are directed to systems for phase measurement which address the problem of phase noise using combinations of a number of strategies including, but not limited to, common-path interferometry, phase referencing, active stabilization and differential measurement. Embodiment are directed to optical devices for imaging small biological objects with light. These embodiments can be applied to the fields of, for example, cellular physiology and neuroscience. These preferred embodiments are based on principles of phase measurements and imaging technologies. The scientific motivation for using phase measurements and imaging technologies is derived from, for example, cellular biology at the sub-micron level which can include, without limitation, imaging origins of dysplasia, cellular communication, neuronal transmission and implementation of the genetic code. The structure and dynamics of sub-cellular constituents cannot be currently studied in their native state using the existing methods and technologies including, for example, x-ray and neutron scattering. In contrast, light based techniques with nanometer resolution enable the cellular machinery to be studied in its native state.

7595889, Sep 29, 2009

Oct 11, 2006

11/548468

Adam Wax - Chapel Hill NC, US
John W. Pyhtila - Durham NC, US

Duke University - Durham NC

G01B 9/02
G01J 3/45
G01B 11/02

356456, 356479, 356497

Fourier domain a/LCI (faLCI) system and method which enables in vivo data acquisition at rapid rates using a single scan. Angle-resolved and depth-resolved spectra information is obtained with one scan. The reference arm can remain fixed with respect to the sample due to only one scan required. A reference signal and a reflected sample signal are cross-correlated and dispersed at a multitude of reflected angles off of the sample, thereby representing reflections from a multitude of points on the sample at the same time in parallel. Information about all depths of the sample at each of the multitude of different points on the sample can be obtained with one scan on the order of approximately 40 milliseconds. From the spatial, cross-correlated reference signal, structural (size) information can also be obtained using techniques that allow size information of scatterers to be obtained from angle-resolved data.

7903254, Mar 8, 2011

Aug 10, 2009

12/538309

Adam Wax - Chapel Hill NC, US
John W. Pyhtila - Durham NC, US

Duke University - Durham NC

G01B 9/02
G01J 3/45
G01N 21/00

356456

Fourier domain a/LCI (faLCI) system and method which enables in vivo data acquisition at rapid rates using a single scan. Angle-resolved and depth-resolved spectra information is obtained with one scan. The reference arm can remain fixed with respect to the sample due to only one scan required. A reference signal and a reflected sample signal are cross-correlated and dispersed at a multitude of reflected angles off of the sample, thereby representing reflections from a multitude of points on the sample at the same time in parallel. Information about all depths of the sample at each of the multitude of different points on the sample can be obtained with one scan on the order of approximately 40 milliseconds. From the spatial, cross-correlated reference signal, structural (size) information can also be obtained using techniques that allow size information of scatterers to be obtained from angle-resolved data.

RE42497, Jun 28, 2011

Sep 5, 2008

12/205248

Adam Wax - Chapel Hill NC, US

Duke University - Durham NC

G01B 9/02

356497

An apparatus and method for obtaining depth-resolved spectra for the purpose of determining the size of scatterers by measuring their elastic scattering properties. Depth resolution is achieved by using a white light source in a Michelson interferometer and dispersing a mixed signal and reference fields. The measured spectrum is Fourier transformed to obtain an axial spatial cross-correlation between the signal and reference fields with near 1 μm depth-resolution. The spectral dependence of scattering by the sample is determined by windowing the spectrum to measure the scattering amplitude as a function of wavenumber.