Andrew N Cleland, Age 6311177 Phillippi Ave, Pacoima, CA 91331

Andrew Cleland Phones & Addresses

Chicago, IL

Pacoima, CA

Carson City, NV

5092 Cathedral Oaks Rd, Santa Barbara, CA 93111 (805) 967-6050

Cornville, AZ

Santa Maria, CA

Gresham, OR

Temple City, CA

Alhambra, CA

5092 Cathedral Oaks Rd, Santa Barbara, CA 93111

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Andrew N Cleland

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Work

Position: Executive, Administrative, and Managerial Occupations

Education

Degree: Bachelor's degree or higher

Industries

Construction

Mentions for Andrew N Cleland

Andrew Cleland resumes & CV records

Resumes

Andrew Cleland Photo 36

General Superintendent At Van's Industrial

Location:
Greater Chicago Area
Industry:
Construction

Publications & IP owners

Us Patents

Device And Method For Resonant High-Speed Microscopic Impedance Probe

US Patent:
7451646, Nov 18, 2008
Filed:
Jul 28, 2006
Appl. No.:
11/460965
Inventors:
Andrew N. Cleland - Santa Barbara CA, US
Hyongsok T. Soh - Santa Barbara CA, US
Assignee:
The Regents of the University of California - Oakland CA
International Classification:
G01N 19/00
G01F 23/26
A61B 5/05
US Classification:
7333504, 73304 C, 324658, 324686, 340620, 600407
Abstract:
A resonant high-speed microscopic impedance probe useful for small scale impedance measurements and/or cell and particle counting.

High Throughput Label Free Nanoparticle Detection And Size Assay

US Patent:
2012019, Aug 2, 2012
Filed:
Jan 31, 2012
Appl. No.:
13/362220
Inventors:
Jean-Luc Fraikin - Boulder CO, US
Andrew N. Cleland - Santa Barbara CA, US
Assignee:
THE REGENTS OF THE UNIVERSITY OF CALIFORNIA - Oakland CA
International Classification:
G01N 27/06
US Classification:
324 714
Abstract:
The present invention reports a novel microfluidic analyzer for the high-throughput, label-free measurement of particles suspended in a fluid.The present invention employs the resistive pulse technique (RPT) which affords very high electrical bandwidth for the device, which surpasses that of currently available systems and devices. Further, devices in accordance with the present invention are fabricated with very simple microfabrication technologies, making the present invention more cost efficient and easier to manufacture than currently available devices.

High Throughput Label Free Nanoparticle Detection And Size Assay

US Patent:
2015005, Mar 5, 2015
Filed:
Oct 30, 2014
Appl. No.:
14/528551
Inventors:
- Oakland CA, US
Andrew N. Cleland - Santa Barbara CA, US
Assignee:
THE REGENTS OF THE UNIVERSITY OF CALIFORNIA - Oakland CA
International Classification:
G01N 27/06
G01N 33/18
US Classification:
73 6171
Abstract:
The present invention reports a novel microfluidic analyzer for the high-throughput, label-free measurement of particles suspended in a fluid. The present invention employs the resistive pulse technique (RPT) which affords very high electrical bandwidth for the device, which surpasses that of currently available systems and devices. Further, devices in accordance with the present invention are fabricated with very simple microfabrication technologies, making the present invention more cost efficient and easier to manufacture than currently available devices.

Isbn (Books And Publications)

Foundations Of Nanomechanics: From Solid-State Theory To Device Applications

Author:
Andrew N. Cleland
ISBN #:
3540436618

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