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Brian D Surette, Age 647 Willow St, Milo, ME 04463

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Known as:
Brian Surrette Brian E Philip Rufino
Related to:
James T Darcy 92 Josh C Darcy

Brian Surette Phones & Addresses

7 Willow St, Milo, ME 04463

905 Social St, Woonsocket, RI 02895 (401) 597-6506

201 Harrison Ave, Woonsocket, RI 02895 (401) 597-6506

10 Essex St, Bellingham, MA 02019 (508) 883-1709

94 Lakeshore Dr, Bellingham, MA 02019 (508) 883-1709

Stoneham, MA

PO Box 232, Bellingham, MA 02019 (508) 883-1709

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Work

Position: Protective Service Occupations

Education

Degree: Associate degree or higher

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Career records & work history

License Records

Brian R Surette

Licenses:
License #: HT100040 - Expired
Category: Mechanical
Expiration Date: Mar 31, 2016
Type: Oil Heating Technician Certification

Brian Surette resumes & CV records

Resumes

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Brian Surette

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Brian Surette

Publications & IP owners

Us Patents

Rolling Average Test

US Patent:
2010007, Mar 18, 2010
Filed:
Sep 12, 2008
Appl. No.:
12/210090
Inventors:
Brian Surette - Hudson NH, US
Thomas W. Kelly - Ipswich MA, US
James E. Martin - Hudson NH, US
Bernard Tan - Medford MA, US
Assignee:
ANALOG DEVICES, INC. - Norwood MA
International Classification:
G01R 31/26
US Classification:
702 58
Abstract:
A system and method for performing dynamic in-line testing of semiconductor devices sequentially tests a plurality of semiconductor devices. Test data associated with a predetermined number of semiconductor devices of the sequentially tested semiconductor devices is stored in a data structure. After test data corresponding to a predetermined number of semiconductor devices is stored in the data structure, the following steps are iteratively performed. Statistics concerning the selected devices are calculated using the associated test data. A device that fails to meet a precision setting based on the statistics is marked as an outlier device. Test data stored in the data structure corresponding to an earliest tested semiconductor device in sequence is evicted from the data structure. Test data associated with the next passing tested semiconductor device in sequence is stored in the data structure.

Possible Relatives

David J Surette  Gary Surette  George M Surette  Gerald J Surette  Jeffrey D Surette  Leo P Surette  Linda M Surette  Brian C Stamps  Brian J Stanczyk  Brian K Standifer 

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