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Carl W Puehl, Age 502434 Poseyville Rd, Midland, MI 48640

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Known as:
Carl William Puehl Carl Rd Puehl Karl Puehl

Carl Puehl Phones & Addresses

2434 Poseyville Rd, Midland, MI 48640

5933 Weiss St, Saginaw, MI 48603

5933 Weiss St #Q5, Saginaw, MI 48603

Madison, WI

Houghton, MI

Hancock, MI

Mentions for Carl W Puehl

Carl Puehl resumes & CV records

Resumes

Carl Puehl Photo 5

Carl Puehl

Location:
Saginaw, MI
Industry:
Consumer Services
Work:
Carl's House Repair
Owner, Retired
Carl Puehl Photo 6

Associate Analytical Specialist

Location:
Midland, MI
Work:

Associate Analytical Specialist

Publications & IP owners

Us Patents

Method Of Analyzing A Composition Containing Impurities

US Patent:
2011022, Sep 22, 2011
Filed:
Nov 16, 2009
Appl. No.:
13/129454
Inventors:
John Hadd - Saginaw MI, US
Ron Holmes - Midland MI, US
Carl Puehl - Midland MI, US
International Classification:
G01J 3/28
G01N 1/22
US Classification:
356311, 7386311
Abstract:
A method of analyzing a composition and a method of processing the composition are provided. The composition contains impurities and has a boiling point less than ambient temperature and/or a vapor pressure greater than water at 14.5 C. The method of analyzing the composition comprises a step of providing the composition in a liquid state within a vessel. The composition is chilled in the liquid state within the vessel at a temperature below the boiling point of the composition, thereby maintaining the composition in the liquid state. The chilled composition in the vessel is converted to produce at least one of a vaporized composition and a nebulized composition, which converted composition is introduced into an analytical device. A measurement of content of the impurities of the composition is obtained from the analytical device. The method of processing the composition includes the same steps as the method of analyzing the composition, and but further requires that at least a portion of the composition remains in the supply tank.

Method For Determining A Concentration Of Metal Impurities Contaminating A Silicon Product

US Patent:
2016032, Nov 3, 2016
Filed:
Dec 31, 2014
Appl. No.:
15/108973
Inventors:
- Hemlock MI, US
Carl W. Puehl - Midland MI, US
Dale Franklin Workman - Saginaw MI, US
International Classification:
G01N 1/40
C01B 33/02
Abstract:
A method determines a concentration of metal impurities contaminating a silicon product. The method comprises obtaining a test sample of the silicon product with the metal impurities disposed thereon. The test sample is placed within a first vessel. A first acid solution is added to the first vessel containing the test sample. The test sample is submerged into the first acid solution to produce a mixed solution comprising the first acid solution, the metal impurities, and digested silicon. The undigested silicon is sep crated from the mixed solution. The mixed solution is analyzed to determine the concentration of metal impurities contaminating the silicon product.

Possible Relatives

Carl J Last  Carl D Stanfield  Carl White  Carl A Jones  Carl G Stanley  Carl A Staples  Carl E Starbuck  Carl J Starr  Carl R Stauffer  Carl A Whitehouse 

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