Christopher L Edler, Age 75175 10Th Ave, Port Hadlock, WA 98339
Christopher Edler Phones & Addresses
175 10Th Ave, Port Hadlock, WA 98339 (360) 379-2469
Port Townsend, WA
7814 Goddard Ave, Los Angeles, CA 90045
Torrance, CA
Work
Position:
Craftsman/Blue Collar
Education
Degree:
Associate degree or higher
Mentions for Christopher L Edler
Publications & IP owners
Us Patents
Method Of Applying Boundary Test Patterns
US Patent:
5606565, Feb 25, 1997
Filed:
Feb 14, 1995
Appl. No.:
8/388655
Inventors:
Christopher L. Edler - Los Angeles CA
William D. Farwell - Thousand Oaks CA
Ian Herman - Hermosa Beach CA
Tuan M. Hoang - La Mirada CA
Brian F. Keish - Stanford CA
Alida G. Mascitelli - Thousand Oaks CA
William D. Farwell - Thousand Oaks CA
Ian Herman - Hermosa Beach CA
Tuan M. Hoang - La Mirada CA
Brian F. Keish - Stanford CA
Alida G. Mascitelli - Thousand Oaks CA
Assignee:
Hughes Electronics - Los Angeles CA
International Classification:
H04B 1700
US Classification:
371 223
Abstract:
A boundary scan cell including a three-state output buffer, a test data scan flip-flop for providing an input to the three-state buffer, a control data scan flip-flop for receiving a serial control data input, independent clock signals for independently clocking the test data scan flip-flop and the control data scan flip-flop, and control circuitry for controllably providing the output of the control data scan flip-flop to the three-state output driver such that the enabled state of the three-state output buffer is controlled by the output of the control data scan flip-flop, whereby the enabled state of the three-state output driver is controlled independently of the test data in the test data scan flip-flop.
Boundary Test Cell With Self Masking Capability
US Patent:
5528610, Jun 18, 1996
Filed:
Apr 30, 1992
Appl. No.:
7/876534
Inventors:
Christopher L. Edler - Los Angeles CA
William D. Farwell - Thousand Oaks CA
Ian Herman - Hermosa Beach CA
Tuan M. Hoang - La Mirada CA
Brian F. Keish - Stanford CA
Alida G. Mascitelli - Northridge CA
William D. Farwell - Thousand Oaks CA
Ian Herman - Hermosa Beach CA
Tuan M. Hoang - La Mirada CA
Brian F. Keish - Stanford CA
Alida G. Mascitelli - Northridge CA
Assignee:
Hughes Aircraft Company - Los Angeles CA
International Classification:
G01R 3128
US Classification:
371 223
Abstract:
Boundary scan cells including mask circuitry having a mask latch for storing a mask flag that is serially scanned into the cell via a scan flip-flop. In a boundary scan cell having an output function, control circuitry responsive to the mask flag forces or holds the output of the cell at a state determined by one or more values scanned into the cell via the scan flip-flop if the mask flag is of a predetermined state that indicates the cell is masked. In a boundary scan cell having an input function, control circuitry responsive to the mask flag connects the output of the scan flip-flop to the input of the scan flip-flop if the mask flag is of a predetermined state that indicates the cell is masked.
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