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Daniel W Heyer, Age 763652 Finger Crk SW, Lilburn, GA 30047

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Known as:
Daniel Willard Heyer Jane Heyer Elizabeth Heyer
Related to:
Willard D Heyer

Daniel Heyer Phones & Addresses

3652 Finger Crk, Lilburn, GA 30047 (770) 931-1808 (770) 925-9600

Norcross, GA

Parsippany, NJ

Kingwood, TX

3652 Finger Crk SW, Lilburn, GA 30047 (770) 596-4791

Work

Position: Professional/Technical

Education

Degree: Associate degree or higher

Emails

d***[email protected]

Mentions for Daniel W Heyer

Career records & work history

License Records

Daniel W Heyer

Address:
Lilburn, GA 30047
Licenses:
License #: 062061493 - Active
Issued Date: Mar 5, 2009
Expiration Date: Nov 30, 2017
Type: Licensed Professional Engineer

Daniel Willard Heyer

Address:
3652 Finger Crk Dr, Lilburn, GA
Licenses:
License #: 31636 - Active
Category: Engineers
Issued Date: Dec 9, 1981
Effective Date: Mar 29, 2005
Expiration Date: Feb 28, 2019
Type: Professional Engineer

Daniel Heyer resumes & CV records

Resumes

Daniel Heyer Photo 23

Graduate From La Salle University

Position:
Intelligence Analyst at US Army
Location:
Tacoma, Washington
Industry:
Military
Work:
US Army - ft lewis, washington since Apr 2012
Intelligence Analyst Consumer's Beverages May 2008 - Apr 2012
customer service representative BlackStream LLC Jul 2010 - Jan 2012
Intern Ukrainian Congress Committee of America Jan 2010 - Jan 2010
Election Observer
Education:
La Salle University 2009 - 2011
MA, Russian, Central European, East European and Eurasian Studies State University of New York College at Fredonia 2005 - 2009
BS, International Studies Udmurt State University 2008 - 2008
Russian Language Certificate, Russian language
Skills:
DCGS-A, ArcMap, Intelligence Analysis, Security Clearance, Top Secret, Intelligence, National Security, Counterterrorism, Defense, Army, Military Experience, Military Operations, Information Assurance, DoD, Operational Planning, Military, International Relations, Homeland Security, Government, Google Earth, Physical Security, Federal Government, Trojans
Languages:
Russian
Daniel Heyer Photo 24

Daniel Heyer

Location:
2218 Northpark Dr, Kingwood, TX 77339
Industry:
Civil Engineering
Work:
Efi Global Jul 1990 - Jan 2017
Vice President of Engineering
Education:
Purdue University 1967 - 1971
Bachelors, Engineering
Skills:
Construction, Civil Engineering, Construction Management, Structural Engineering, Roofing, Building Envelope, Wind Damage, Building Failures, Earthquake Damage, Vibrations and Explosives, Complicated Large Losses
Daniel Heyer Photo 25

Daniel Heyer

Location:
United States
Daniel Heyer Photo 26

Daniel Heyer

Location:
United States
Daniel Heyer Photo 27

Vice President Of Engineering At Efi Global

Location:
Greater Atlanta Area
Industry:
Civil Engineering
Daniel Heyer Photo 28

Daniel Heyer

Publications & IP owners

Us Patents

Window Frame Deflection Measurement Device And Method Of Use

US Patent:
8407906, Apr 2, 2013
Filed:
Aug 17, 2011
Appl. No.:
13/199025
Inventors:
Daniel Heyer - Lilburn GA, US
Assignee:
Cunningham Lindsey U.S., Inc. - Lewisville TX
International Classification:
G01C 9/00
G01B 5/20
US Classification:
33375, 33374, 33376, 33533
Abstract:
A portable device for measuring deflection of a surface, comprising an elongate frame having a first end and a second end and a first datum surface, a first removable reference assembly adjacent the first end, a second removable reference adjacent the second end, a deflection gauge attached to the elongate frame between the first removable reference assembly and the second removable reference assembly, and wherein the deflection gauge engages and measures a deflection of the surface relative to the first removable reference assembly and the second removable reference assembly.

Window Frame Deflection Measurement Device And Method Of Use

US Patent:
2012017, Jul 12, 2012
Filed:
Dec 13, 2011
Appl. No.:
13/324916
Inventors:
Daniel Heyer - Lilburn GA, US
International Classification:
G01B 3/56
US Classification:
3350108
Abstract:
A portable device for measuring a deflection of a surface, comprising an elongate frame having a first end and a second end and a first datum surface, a first removable reference support adjacent the first end, a second removable reference support adjacent the second end, a deflection gauge attached to the elongate frame between the first removable reference support and the second removable reference support, and wherein the deflection gauge engages and measures a deflection of the surface relative to the first removable reference support and the second removable reference support.

Window Frame Deflection Measurement Device And Method Of Use

US Patent:
8104187, Jan 31, 2012
Filed:
Nov 10, 2009
Appl. No.:
12/590552
Inventors:
Daniel Heyer - Lilburn GA, US
International Classification:
G01C 9/00
G01B 5/20
US Classification:
33375, 33374, 33376, 33533
Abstract:
A portable device for measuring deflection of a surface, comprising an elongate frame having a first end and a second end and a first datum surface, a first removable reference assembly adjacent the first end, a second removable reference adjacent the second end, a deflection gauge attached to the elongate frame between the first removable reference assembly and the second removable reference assembly, and wherein the deflection gauge engages and measures a deflection of the surface relative to the first removable reference assembly and the second removable reference assembly.

Possible Relatives

David B Heyer  Deborah A Heyer  Aaron Heyer  Diane D Heyer  Donald E Heyer  Donna Heyer  Elizabeth M Heyer  Daniel G Last  Daniel J Johnson  Daniel W Stamps 

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