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David Z Duarte1706 32Nd St, Mesa, AZ 85213

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Related to:
Frank Duarte 88 Darlene Duarte Ida M Casillas 57 Neoma J Saul 86

David Duarte Phones & Addresses

1706 32Nd St, Mesa, AZ 85213 (480) 832-9319

Mesilla Park, NM

16011 N Johnson Rd, Maricopa, AZ 85239 (520) 568-2308

16011 N Johnson Rd #1052, Maricopa, AZ 85239

Mesilla Park, NM

Mentions for David Z Duarte

Career records & work history

Medicine Doctors

David A. Duarte

Specialties:
General Surgery
Work:
David A Duarte MD
1414 S Grand Ave STE 375, Los Angeles, CA 90015
(213) 746-3783 (phone) (213) 746-4362 (fax)
Education:
Medical School
Harvard Medical School
Graduated: 1985
Procedures:
Appendectomy, Laparoscopic Gallbladder Removal, Small Bowel Resection, Thoracoscopy, Hernia Repair, Upper Gastrointestinal Endoscopy
Conditions:
Appendicitis, Cholelethiasis or Cholecystitis, Intestinal Obstruction, Abdominal Hernia, Breast Disorders, Inguinal Hernia, Rectal, Abdomen, Small Intestines, or Colon Cancer, Ventral Hernia
Languages:
English, Spanish
Description:
Dr. Duarte graduated from the Harvard Medical School in 1985. He works in Los Angeles, CA and specializes in General Surgery. Dr. Duarte is affiliated with Beverly Hospital, California Hospital Medical Center and Monterey Park Hospital.
David Duarte Photo 1

David Duarte

Specialties:
Surgery
Trauma Surgery
Education:
Harvard University(1985)

Publications & IP owners

Us Patents

On-Die Digital-To-Analog Conversion Testing

US Patent:
8314725, Nov 20, 2012
Filed:
Sep 15, 2010
Appl. No.:
12/883125
Inventors:
Paola Zepeda - Chandler AZ, US
David E. Duarte - Portland OR, US
Gregory F. Taylor - Portland OR, US
Atul Maheshwari - Portland OR, US
Assignee:
Intel Corporation - Santa Clara CA
International Classification:
H03M 1/10
US Classification:
341120, 341118, 341119, 341121, 341155
Abstract:
In one embodiment, an analog-to-digital conversion in an integrated circuit is evaluated by an on-die testing circuit. For example, the on-die test circuit can characterize one or both of the linearity and monotonicity of the digital-to-analog conversion. The value of a conversion output for a digital input code may be compared to the value of a prior conversion output of a prior step to provide digital difference values for each step of a sweep of digital input codes. Digital difference values may be compared to one or more predetermined limits to provide one or more pass/fail tests on-board the die. Other embodiments are described and claimed.

Possible Relatives

Cynthia S Duarte  Dawnmarie M Duarte  Deanna R Duarte  Daisy T Duarte  Debby K Duarte  Dana C Duarte  Dania M Duarte  David Last  David W Johnson  David Stamps 

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