David Sieracki resumes & CV records
Resumes
David Sieracki
Enginering Manager At Lockheed Martin
Location:
Buffalo/Niagara, New York Area
Industry:
Defense & Space
David L Sieracki, Age 65278 Bryant St, Depew, NY 14043
David Sieracki Phones & Addresses
278 Bryant St, Depew, NY 14043 (716) 684-1907
392 Terrace Blvd, Depew, NY 14043 (716) 683-5695
Buffalo, NY
Niagara Falls, NY
Erin, NY
392 Terrace Blvd, Depew, NY 14043 (716) 536-6539
Work
Position:
Executive, Administrative, and Managerial Occupations
Education
Degree:
High school graduate or higher
Emails
Mentions for David L Sieracki
Publications & IP owners
Us Patents
Gravity Gradiometer And Method For Calculating A Gravity Tensor With Increased Accuracy
US Patent:
6799459, Oct 5, 2004
Filed:
Mar 6, 2003
Appl. No.:
10/384370
Inventors:
Daniel E. Dosch - Hamburg NY
David L. Sieracki - Depew NY
David L. Sieracki - Depew NY
Assignee:
Lockheed Martin Corporation - Bethesda MD
International Classification:
G01V 700
US Classification:
73382G
Abstract:
A method includes measuring an acceleration along an input axis of an accelerometer mounted to a gradiometer disc, the accelerometer having a coordinate axis that is parallel to a spin axis of the disc, and includes calculating a gravity tensor element as a function of the measured acceleration and a component of the measured acceleration caused by an acceleration along the coordinate axis. Consequently, this technique typically yields a more accurate calculation of the gravitational field by accounting for undesired accelerations picked up by accelerometers having input axes that are not parallel to the gradiometer disc.
Gravity Gradiometer System
US Patent:
8375785, Feb 19, 2013
Filed:
Sep 8, 2008
Appl. No.:
12/206305
Inventors:
Thomas Metzger - Wheatfield NY, US
David L. Sieracki - Depew NY, US
Daniel E. Dosch - Hamburg NY, US
David L. Sieracki - Depew NY, US
Daniel E. Dosch - Hamburg NY, US
Assignee:
Lockheed Martin Corporation - Bethesda MD
International Classification:
G01V 7/00
US Classification:
73382G
Abstract:
A method and apparatus for an improved gravity gradiometer are disclosed.
System And Process For Optimizing Gravity Gradiometer Measurements
US Patent:
6125698, Oct 3, 2000
Filed:
May 11, 1999
Appl. No.:
9/309507
Inventors:
Melvin Schweitzer - Port Washington NY
Walter K. Feldman - Smithtown NY
William F Konig - Manhasset NY
Daniel J. DiFrancesco - North Tonawanda NY
David L. Sieracki - Depew NY
Carlo P. San Giovanni - Commack NY
Walter K. Feldman - Smithtown NY
William F Konig - Manhasset NY
Daniel J. DiFrancesco - North Tonawanda NY
David L. Sieracki - Depew NY
Carlo P. San Giovanni - Commack NY
Assignee:
Lockheed Martin Corporation - Bethesda MD
International Classification:
G01V 700
US Classification:
73382G
Abstract:
Gravity gradient measurements taken by an accelerometer type gradiometer are optimized by tilting the measuring plane of the instrument by a selected angle above and below the horizontal to obtain data that can be differenced or otherwise processed to remove instrument bias and by taking data at first and then at a second orthogonal azimuth heading to obtain absolute non-relative gradient measurements.
System And Process For Optimizing Gravity Gradiometer Measurements
US Patent:
6212952, Apr 10, 2001
Filed:
Feb 18, 2000
Appl. No.:
9/506380
Inventors:
Melvin Schweitzer - Port Washington NY
Walter K. Feldman - Smithtown NY
William F Konig - Manhasset NY
Daniel J. DiFrancesco - North Tonawanda NY
David L. Sieracki - Depew NY
Carlo P. San Giovanni - Commack NY
Walter K. Feldman - Smithtown NY
William F Konig - Manhasset NY
Daniel J. DiFrancesco - North Tonawanda NY
David L. Sieracki - Depew NY
Carlo P. San Giovanni - Commack NY
Assignee:
Lockheed Martin Corporation - Bethesada MD
International Classification:
G01V 700
US Classification:
73382G
Abstract:
Gravity gradient measurements taken by an accelerometer type gradiometer are optimized by tilting the measuring plane of the instrument by a selected angle above and below the horizontal to obtain data that can be differenced or otherwise processed to remove instrument bias and by taking data at first and then at a second orthogonal azimuth heading to obtain absolute non-relative gradient measurements.
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