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Edward J Seng1765 Greenleaf St, Bethlehem, PA 18017

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Known as:
Eddie J Seng Ed Seng Edward A Seng

Edward Seng Phones & Addresses

1765 Greenleaf St, Bethlehem, PA 18017 (610) 865-4077

Boston, MA

5 Apple Blossom Rd, Andover, MA 01810

Aurora, CO

135 High St, State College, PA 16801 (814) 867-0326

Allentown, PA

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Resumes

Edward Seng Photo 23

Retired At Retired Chartered Engineer

Location:
Bethlehem, PA
Industry:
Transportation/Trucking/Railroad
Edward Seng Photo 24

Edward Seng

Location:
United States

Publications & IP owners

Us Patents

Automated Test System With Event Detection Capability

US Patent:
2015012, May 7, 2015
Filed:
Nov 6, 2013
Appl. No.:
14/073739
Inventors:
Ronald A. Sartschev - Andover MA, US
Edward J. Seng - Andover MA, US
Marc Reuben Hutner - Toronto, CA
Assignee:
Teradyne, Inc. - North Reading MA
International Classification:
G01R 31/319
US Classification:
714744
Abstract:
A test technique that may be implemented in an automated test system for testing semiconductor devices. The test technique may enable the fast detection of a signal transition, such as an edge, within a waveform and the timing of that event. Circuitry within a digital instrument that can be quickly and flexibly programmed may, at least in part, implement the test technique. That circuitry may be simply programmed with testing parameters, such that application of the technique may lead to faster test development and faster times. In operation, that circuitry receives parameters specifying parameters of a window over a waveform in which samples of the waveform will be taken to detect the signal transition. The circuitry may convert these parameters into control signals for other components in the test system, such as an edge generator or pin electronics, to take a programmed number of samples at desired times.

Possible Relatives

David F Seng  Dale P Seng  Denise I Seng  Diana L Seng  Grace T Seng  Kenneth J Seng  Kim S Seng  Edward H Standish  Edward L Stanford  Edward K Jolly 

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