Erika L Beskar, Age 481217 Vineland Ct, Allen, TX 75002

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Erika Beskar Phones & Addresses

1217 Vineland Ct, Allen, TX 75002

Mc Kinney, TX

Dallas, TX

Guntersville, AL

Huntsville, AL

Plano, TX

Colton, TX

Social networks

Erika L Beskar

Work

Company: Texas instruments Sep 2020 Position: Business lead protection devices, smts

Education

Degree: Bachelors, Bachelor of Science In Electrical Engineering School / High School: Tecnológico De Monterrey 1995 to 2000 Specialities: Communications

Skills

Testing • Test Automation • Test Engineering • Semiconductors • Labview • Analog • Mixed Signal • Automation • Embedded Systems • Pcb Design • Test Equipment • Electronics • Device Drivers • Debugging • Fpga • Test Stand • Software Development • C • Rf • Semiconductor Industry • Microcontrollers • Engineering Management • Firmware • Electrical Engineering • Orcad • Integrated Circuits • Xilinx • Gpib • Labwindows/Cvi • Field Programmable Gate Arrays • Management • Radio Frequency

Industries

Semiconductors

Mentions for Erika L Beskar

Resumes & CV records

Resumes

Business Lead Protection Devices, Smts

Location:

1217 Vineland Ct, Allen, TX 75002

Industry:

Semiconductors

Work:

Texas Instruments
Business Lead Protection Devices, Smts Sanmina Dec 2002 - May 2005
Senior Software Engineer Consultant White Rock Networks May 2001 - Sep 2002
Software Engineer Symtx 2000 - 2001
Project Engineer

Education:

Tecnológico De Monterrey 1995 - 2000
Bachelors, Bachelor of Science In Electrical Engineering, Communications

Skills:

Testing, Test Automation, Test Engineering, Semiconductors, Labview, Analog, Mixed Signal, Automation, Embedded Systems, Pcb Design, Test Equipment, Electronics, Device Drivers, Debugging, Fpga, Test Stand, Software Development, C, Rf, Semiconductor Industry, Microcontrollers, Engineering Management, Firmware, Electrical Engineering, Orcad, Integrated Circuits, Xilinx, Gpib, Labwindows/Cvi, Field Programmable Gate Arrays, Management, Radio Frequency

Publications & IP owners

Us Patents

Test Definer, A Method Of Automatically Determining And Representing Functional Tests For A Pcb Having Analog Components And A Test System

US Patent:

2009010, Apr 23, 2009

Filed:

Oct 21, 2008

Appl. No.:

12/255534

Inventors:

Pramod Variyam - Plano TX, US
Sudhir Wokhlu - Plano TX, US
Srividya Sundar - Tuscaloosa AL, US
Venkat Kalyanaraman - Richardson TX, US
Bruce Kim - Tuscaloosa AL, US
Raul I. Rousselin - Wylie TX, US
Toby O. Byrd - Honey Grove TX, US
Erika L. Beskar - Allen TX, US

Assignee:

Texas Instruments Incorporated - Dallas TX

International Classification:

G01R 31/28

US Classification:

702124

Abstract:

A test definer, a method for automatically determining functional tests for a printed circuit board (PCB) having analog components and a test system. In one embodiment, the test definer includes: (1) a circuit builder configured to generate a representative circuit of the PCB based on schematic information thereof, (2) a circuit organizer configured to partition the representative circuit into testable sub-circuits and (3) a specification generator configured to automatically determine functionality tests for the PCB based on the sub-circuits, obtain expected values from the functionality tests and generate platform-independent specifications representing the functionality tests and the expected values.

Possible Relatives

Erika D Johnston Erika R Stanton Erika L Whiting Erika K Whitman Erika R Steele Erika B Stein Erika N Jordan Erika B Juarez Erika L Kahn

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