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Frederick C ChenRockville, MD

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Known as:
Fred Chen

Frederick Chen Phones & Addresses

Rockville, MD

Fremont, CA

175 Calvert Dr APT E206, Cupertino, CA 95014

Seattle, WA

Work

Company: Central coast endoscopy center Address: 243 Green Valley Rd Ste E, Freedom, CA 95019 Phones: (831) 728-1410 Position: President Industries: Offices and Clinics of Doctors of Medicine

Mentions for Frederick C Chen

Career records & work history

Medicine Doctors

Frederick Chen Photo 1

Dr. Frederick M Chen, Seattle WA - MD (Doctor of Medicine)

Specialties:
Family Medicine
Address:
University Of Washington
1959 Ne Pacific St, Seattle, WA 98195
(206) 598-3300 (Phone) (206) 667-6643 (Fax)
HARBORVIEW NEUROSURGERY
401 Broadway Suite 2018, Seattle, WA 98122
(206) 744-9300 (Phone) (206) 744-9943 (Fax)
Harborview Family Medicine Clin
401 Broadway Suite 2075, Seattle, WA 98122
(206) 744-8274 (Phone)
UNIVERSITY OF WASHINGTON
1959 Ne Pacific St, Seattle, WA 98195
(206) 598-5637 (Phone) (206) 598-4303 (Fax)
UNIVERSITY OF WASHINGTON
1959 Ne Pacific St, Seattle, WA 98195
(206) 598-3300 (Phone) (206) 667-6643 (Fax)
Certifications:
Family Practice, 1999
Awards:
Healthgrades Honor Roll
Languages:
English
Hospitals:
FREDERICK W CHEN MD
243 Green Valley Rd Suite E, Freedom, CA 95019
Watsonville Community Hospital
75 Nielson Street, Watsonville, CA 95076
University Of Washington
1959 Ne Pacific St, Seattle, WA 98195
HARBORVIEW NEUROSURGERY
401 Broadway Suite 2018, Seattle, WA 98122
UNIVERSITY OF WASHINGTON
1959 Ne Pacific St, Seattle, WA 98195
UNIVERSITY OF WASHINGTON
1959 Ne Pacific St, Seattle, WA 98195
Harborview Family Medicine Clin
401 Broadway Suite 2075, Seattle, WA 98122
Harborview Medical Center
325 9Th Avenue, Seattle, WA 98104
University of Washington Medical Center
1959 North East Pacific Street, Seattle, WA 98195
Education:
Medical School
Univ Of Ca
Graduated: 1995
Medical School
University Of Wa School Of Med
Graduated: 1995
Frederick Chen Photo 2

Dr. Frederick W Chen - MD (Doctor of Medicine)

Hospitals:
FREDERICK W CHEN MD
243 Green Valley Rd Suite E, Freedom, CA 95019
Watsonville Community Hospital
75 Nielson Street, Watsonville, CA 95076
Education:
Medical Schools
Trinity College, University Of Dublin, University Of Dublin, School Of Medicine

Frederick M. Chen

Specialties:
Family Medicine
Work:
UW PhysiciansHarborview Family Medicine Clinic
401 Broadway STE 2075, Seattle, WA 98122
(206) 744-8274 (phone) (206) 744-6939 (fax)
Site
Education:
Medical School
University of California, San Francisco School of Medicine
Graduated: 1996
Procedures:
Arthrocentesis, Destruction of Benign/Premalignant Skin Lesions, Vaccine Administration, Wound Care
Conditions:
Acne, Acute Upper Respiratory Tract Infections, Allergic Rhinitis, Anemia, Bronchial Asthma, Constipation, Contact Dermatitis, Diabetes Mellitus (DM), Gastroesophageal Reflux Disease (GERD), Hypertension (HTN), Hypothyroidism, Osteoarthritis, Substance Abuse and/or Dependency, Abnormal Vaginal Bleeding, Acute Pharyngitis, Acute Renal Failure, Acute Sinusitis, Alcohol Dependence, Ankylosing Spondylitis (AS), Anxiety Dissociative and Somatoform Disorders, Anxiety Phobic Disorders, Atopic Dermatitis, Bipolar Disorder, Breast Disorders, Candidiasis, Candidiasis of Vulva and Vagina, Cardiac Arrhythmia, Cardiomyopathy, Cataract, Cholelethiasis or Cholecystitis, Chronic Bronchitis, Chronic Renal Disease, Chronic Sinusitis, Depressive Disorders, Dermatitis, Disorders of Lipoid Metabolism, Diverticulosis, Erectile Dysfunction (ED), Female Infertility, Fractures, Dislocations, Derangement, and Sprains, Gastrointestinal Hemorrhage, Gout, Hearing Loss, Hemorrhagic stroke, Hemorrhoids, Herpes Zoster, Infectious Liver Disease, Inflammatory Bowel Disease (IBD), Internal Derangement of Knee, Iron Deficiency Anemia, Lateral Epicondylitis, Migraine Headache, Otitis Media, Overweight and Obesity, Peripheral Nerve Disorders, Pneumonia, Post Traumatic Stress Disorder (PTSD), Psoriasis, Rheumatoid Arthritis, Schizophrenia, Sciatica, Skin and Subcutaneous Infections, Systemic Lupus Erythematosus, Tension Headache, Tinea Pedis, Urinary Tract Infection (UT), Varicose Veins, Venous Embolism and Thrombosis, Vitamin D Deficiency
Languages:
English
Description:
Dr. Chen graduated from the University of California, San Francisco School of Medicine in 1996. He works in Seattle, WA and specializes in Family Medicine. Dr. Chen is affiliated with Harborview Medical Center and Northwest Hospital & Medical Center.

Frederick Y. Chen

Specialties:
Congenital Cardiac Surgery (Thoracic Surgery)
Work:
Tufts Medical Center Cardiothoracic Surgery
800 Washington St BLDG FL6, Boston, MA 02111
(617) 636-5594 (phone) (617) 636-6410 (fax)
Education:
Medical School
Harvard Medical School
Graduated: 1997
Procedures:
Lung Biopsy, Coronary Artery Bypass, Heart Valve Procedures, Thoracoscopy
Languages:
English
Description:
Dr. Chen graduated from the Harvard Medical School in 1997. He works in Boston, MA and specializes in Congenital Cardiac Surgery (Thoracic Surgery). Dr. Chen is affiliated with Tufts Medical Center.

Frederick Chen

Specialties:
Diagnostic Radiology
Work:
Mayo Clinic
13400 E Shea Blvd, Scottsdale, AZ 85259
(480) 301-8000 (phone) (480) 342-2544 (fax)
Site
Mayo ClinicMayo Clinic Hospital Arizona
5777 E Mayo Blvd, Phoenix, AZ 85054
(480) 301-8000 (phone) (480) 342-3475 (fax)
Site
Education:
Medical School
Duke University School of Medicine
Graduated: 1994
Languages:
English, Spanish
Description:
Dr. Chen graduated from the Duke University School of Medicine in 1994. He works in Phoenix, AZ and 1 other location and specializes in Diagnostic Radiology. Dr. Chen is affiliated with Mayo Clinic Hospital.
Frederick Chen Photo 3

Frederick Yen-Ching Chen

Specialties:
Thoracic Surgery
Cardiothoracic Vascular Surgery
Surgery
Adult Medicine
Education:
Harvard University(1997)
Frederick Chen Photo 4

Frederick Wen Kang Chen

Specialties:
Gastroenterology
Frederick Chen Photo 5

Frederick Wen Kang Chen, Freedom CA

Specialties:
Gastroenterologist
Address:
243 Green Valley Rd, Freedom, CA 95019

Frederick Chen resumes & CV records

Resumes

Frederick Chen Photo 43

Demand Coordinator At Openx

Position:
Demand Coordinator at OpenX, Social Media Coordinator at Sub5zero
Location:
Greater Los Angeles Area
Industry:
Entertainment
Work:
OpenX since Mar 2013
Demand Coordinator Sub5zero since Jan 2012
Social Media Coordinator Cie Games Aug 2012 - Jan 2013
Car Town Content Coordinator BBC Worldwide - Century City, CA May 2011 - Feb 2012
Marketing Manager CBS Television Distribution - Santa Monica, CA Sep 2010 - Dec 2010
Marketing Intern DeHood - Palo Alto, CA May 2010 - Aug 2010
Online Marketing Coordinator 20th Century Fox - Century City, CA Jan 2010 - May 2010
Spring Marketing and Promotions Intern
Education:
University of Southern California - Marshall School of Business 2008 - 2012
Henry M. Gunn High School
Interests:
advertising, automotive marketing, automotive performance, graphic design, social media marketing, surfing, skimboarding, longboarding, rock climbing, squash
Frederick Chen Photo 44

Financial Economist At Office Of The Comptroller Of The Currency

Location:
Washington D.C. Metro Area
Industry:
Financial Services
Frederick Chen Photo 45

Frederick Chen

Location:
United States
Frederick Chen Photo 46

Frederick Chen

Location:
United States
Frederick Chen Photo 47

Frederick Chen

Location:
United States

Publications & IP owners

Us Patents

Photomask Frame Modification To Eliminate Process Induced Critical Dimension Control Variation

US Patent:
6485869, Nov 26, 2002
Filed:
Oct 1, 1999
Appl. No.:
09/411729
Inventors:
Wilman Tsai - Saratoga CA
Marilyn Kamna - San Jose CA
Frederick Chen - San Jose CA
Jeff Farnsworth - Los Gatos CA
Assignee:
Intel Corporation - Santa Clara CA
International Classification:
G03F 900
US Classification:
430 5
Abstract:
An apparatus comprising a mask having an active device area and a moat. The moat substantially surrounds the mask active device area and has a width greater than a plasma specie diffusional length. A method comprising depositing a layer of resist on a mask substrate having transparent and opaque layers; and exposing the resist layer to radiation. The radiation is patterned to produce features within an active device area. The radiation is also patterned to produce a moat substantially surrounding the active device area having a width greater than a plasma specie diffusional length.

Photomask Frame Modification To Eliminate Process Induced Critical Dimension Control Variation

US Patent:
6692878, Feb 17, 2004
Filed:
Aug 15, 2002
Appl. No.:
10/222655
Inventors:
Wilman Tsai - Saratoga CA
Marilyn Kamna - San Jose CA
Frederick Chen - San Jose CA
Jeff Farnsworth - Los Gatos CA
Assignee:
Intel Corporation - Santa Clara CA
International Classification:
G03F 900
US Classification:
430 5, 355 18
Abstract:
An apparatus comprising a mask having an active device area and a moat. The moat substantially surrounds the mask active device area and has a width greater than a plasma specie diffusional length. A method comprising depositing a layer of resist on a mask substrate having transparent and opaque layers; and exposing the resist layer to radiation. The radiation is patterned to produce features within an active device area. The radiation is also patterned to produce a moat substantially surrounding the active device area having a width greater than a plasma specie diffusional length.

Advanced Mask Patterning With Patterning Layer

US Patent:
7460209, Dec 2, 2008
Filed:
Mar 28, 2005
Appl. No.:
11/092993
Inventors:
Jian Ma - San Jose CA, US
Phil Freiberger - Santa Clara CA, US
Karmen Yung - Sunnyvale CA, US
Frederick Chen - Cupertino CA, US
Chaoyang Li - San Jose CA, US
Steve Mak - Pleasanton CA, US
Assignee:
Intel Corporation - Santa Clara CA
International Classification:
G03B 27/42
G03F 1/00
US Classification:
355 53, 430 5
Abstract:
An imaging structure such as a mask or reticle may be fabricated using a patterning layer on an imaging layer. The patterning layer may have substantially different etch properties than the imaging layer. A first etch process may be selective of the patterning layer with respect to a resist layer. A second etch process may be selective of the imaging layer with respect to the patterning layer.

Advanced Mask Patterning With Patterning Layer

US Patent:
2008030, Dec 18, 2008
Filed:
Aug 20, 2008
Appl. No.:
12/194689
Inventors:
JIAN MA - San Jose CA, US
Phil Freiberger - Santa Clara CA, US
Karmen Yung - Sunnyvale CA, US
Frederick Chen - Cupertino CA, US
Chaoyang Li - San Jose CA, US
Steve Mak - Pleasanton CA, US
Assignee:
INTEL CORPORATION - SANTA CLARA CA
International Classification:
B44C 1/22
B32B 7/02
US Classification:
216 47, 428212
Abstract:
An imaging structure such as a mask or reticle may be fabricated using a patterning layer on an imaging layer. The patterning layer may have substantially different etch properties than the imaging layer. A first etch process may be selective of the patterning layer with respect to a resist layer. A second etch process may be selective of the imaging layer with respect to the patterning layer.

Data Write-In Method And Non-Volatile Memory

US Patent:
2021007, Mar 11, 2021
Filed:
Apr 15, 2020
Appl. No.:
16/849976
Inventors:
- Taichung City, TW
Chang-Tsung Pai - Taichung City, TW
Yu-Ting Chen - Taichung City, TW
He-Hsuan Chao - Taichung City, TW
Ming-Che Lin - Taichung City, TW
Frederick Chen - San Jose CA, US
Assignee:
Winbond Electronics Corp. - Taichung City
International Classification:
G11C 13/00
Abstract:
A data write-in method and a non-volatile memory are provided. The data write-in method includes: providing a reset voltage to a plurality of selected memory cells according to a first flag, and recursively performing a reset process for the plurality of selected memory cells; setting a second flag according to a plurality of first verification currents of the plurality of selected memory cells; and under a condition that the second flag is set: providing a set voltage to the plurality of selected memory cells according to a resistance of the plurality of selected memory cells; and setting the first flag according to a plurality of second verification currents of the plurality of selected memory cells.

Resistance Change Memory Device And Fabrication Method Thereof

US Patent:
2019002, Jan 24, 2019
Filed:
Sep 12, 2018
Appl. No.:
16/129764
Inventors:
- Taichung City, TW
Frederick Chen - San Jose CA, US
Assignee:
Winbond Electronics Corp. - Taichung City
International Classification:
H01L 45/00
G11C 11/00
G11C 13/00
H01L 27/24
Abstract:
The resistance change memory device including a first resistance change memory element, a second resistance change memory element, and a memory controller is provided. The first resistance change memory element is disposed on a chip. The second resistance change memory element is disposed on the same chip. The memory controller is disposed on the same chip. The memory controller is configured to control data access of the first resistance change memory element and the second resistance change memory element. An accessing frequency of the first resistance change memory element is different from an accessing frequency of the second resistance change memory element.

Semiconductor Device And Method Of Fabricating The Same

US Patent:
2018031, Nov 1, 2018
Filed:
Apr 28, 2017
Appl. No.:
15/499904
Inventors:
- Taichung City, TW
Frederick Chen - San Jose CA, US
Assignee:
Winbond Electronics Corp. - Taichung City
International Classification:
H01L 27/24
H01L 45/00
H01L 29/78
H01L 29/423
H01L 27/22
H01L 43/02
G11C 11/16
H01L 43/08
H01L 23/528
H01L 29/06
H01L 43/12
Abstract:
Provided are a semiconductor device including a plurality of transistors and a plurality of memory cells. Each of the transistors includes a gate structure and a source/drain region. The memory cells are respectively located over the gate structures. A lower electrode of each of the memory cells and an upper electrode of an adjacent memory cell are electrically connected to the source/drain region between corresponding two transistors.

Resistance Change Memory Device And Fabrication Method Thereof

US Patent:
2018017, Jun 21, 2018
Filed:
Dec 15, 2016
Appl. No.:
15/379505
Inventors:
- Taichung City, TW
Frederick Chen - San Jose CA, US
Assignee:
Winbond Electronics Corp. - Taichung City
International Classification:
H01L 45/00
G11C 13/00
Abstract:
The resistance change memory device including a first resistance change memory element, a second resistance change memory element, and a memory controller is provided. The first resistance change memory element is disposed on a chip. The second resistance change memory element is disposed on the same chip. The memory controller is disposed on the same chip. The memory controller is configured to control data access of the first resistance change memory element and the second resistance change memory element. An accessing frequency of the first resistance change memory element is different from an accessing frequency of the second resistance change memory element.

Possible Relatives

De X Chen  Deanna M Chen  Daisy C Chen  Deborah L Chen  Danny W Chen  Dennis C Chen  Denny C Chen  Frederick G Johnson  Frederick Z Johnston  Frederick A Stark 

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