People Background Check
Find People:

Jun Men Wan, Age 58El Monte, CA

Get Report
Known as:
Jun M Wan Men Jun Wan Men J Wan Jun Wan Men Menjun Wan Wan Men Wan M Jun
Related to:
Tommy Chan 61

Jun Wan Phones & Addresses

El Monte, CA

Alhambra, CA

San Jose, CA

Santa Clara, CA

Monterey Park, CA

San Gabriel, CA

2721 Lexington Ave, El Monte, CA 91733

Show more

Mentions for Jun Men Wan

Jun Wan resumes & CV records

Resumes

Jun Wan Photo 30

Manager

Work:
Cmi
Manager
Jun Wan Photo 31

Jun Wan

Jun Wan Photo 32

Jun Wan

Jun Wan Photo 33

Jun Wan

Location:
United States
Jun Wan Photo 34

Professional

Location:
Tucson, Arizona
Industry:
Information Technology and Services
Jun Wan Photo 35

Staff Designer At National Semiconductor

Position:
Staff Research Engineer, NS research lab at National Semiconductor
Location:
Manchester, New Hampshire
Industry:
Semiconductors
Work:
National Semiconductor since Apr 2008
Staff Research Engineer, NS research lab National Semiconductor Mar 2006 - Apr 2008
Design Manager National Semiconductor Aug 2001 - Mar 2006
Senior Design Engineer Atmel Corporation 2000 - 2001
Circuit Designer
Skills:
Product definition/Market exploration, Low-power precision analog circuits, High voltage, high speed circuits, Circuits, Low-power Design
Honor & Awards:
20 patents Awarded, including -RFID temperature logger incorporating a frequency ratio digitizing temperature sensor -Emitter area trim scheme for a PTAT current source -Charge balancing method in a current input ADC -Frequency ratio digitizing temperature sensor with linearity correction -Clock generator circuit stabilized over temperature, process and power supply variations -Power-on reset circuit with low standby current and self-adaptive reset pulse width - Digitizing temperature measurement system - Method for synchronized delta-VBE measurement for calculating die temperature - Constant temperature coefficient self-regulating CMOS current source

Publications & IP owners

Us Patents

System, Method, And Computer Program Product For Identifying Manufacturing-Specific Regions In Object Models

US Patent:
7299165, Nov 20, 2007
Filed:
Oct 16, 2003
Appl. No.:
10/687556
Inventors:
Jun Wan - Cerritos CA, US
Chee-Keong Chong - Irvine CA, US
Assignee:
UGS Corp. - Plano TX
International Classification:
G06G 7/48
US Classification:
703 6, 345419
Abstract:
A system, method, and computer program product for decomposing a product model into manufacturing specific regions, including a corresponding system, method, and computer program product incorporating an object view visualization method for decomposing a product model into manufacturing specific regions.

System, Method, And Computer Program Product For Determining Wall Thickness In Graphic Model

US Patent:
7454319, Nov 18, 2008
Filed:
Nov 19, 2003
Appl. No.:
10/717273
Inventors:
Jun Wan - Cerritos CA, US
Chee-Keong Chong - Irvine CA, US
Zhi Li - Cypress CA, US
International Classification:
G06K 9/36
US Classification:
703 1, 382286
Abstract:
A system, method, and computer program product for measuring wall thickness. After an internal body topology of the model is generated, the topology is traversed between wall elements to determine wall thickness.

System And Method For Calculating The Internal Volume Of A Solid Model

US Patent:
2008029, Nov 27, 2008
Filed:
Mar 20, 2008
Appl. No.:
12/052387
Inventors:
Jun Wan - Cerritos CA, US
Chee-Keong Chong - Irvine CA, US
Guirong Shi - Shanghai, CN
JunBo Zhang - Shanghai, CN
Lei Yang - Shanghai, CN
Raymond Kok - Huntington Beach CA, US
International Classification:
G01B 21/28
US Classification:
702156
Abstract:
A system, method, and computer program for calculating internal volume of a solid model, comprising selecting a seed cube that is internal to a solid model; determining a plurality of surrounding cubes surrounding said seed cube; and calculating a boundary volume from said plurality of surrounding cubes, and appropriate means and computer-readable instructions.

System, Method, And Computer Program Product For Determining Wall Thickness In Graphic Model

US Patent:
2009008, Mar 26, 2009
Filed:
Sep 24, 2008
Appl. No.:
12/237193
Inventors:
Jun Wan - Cerritos CA, US
Chee-Keong Chong - Irvine CA, US
Zhi Li - Cypress CA, US
International Classification:
G06F 17/50
US Classification:
703 1
Abstract:
A system, method, and computer program product for measuring wall thickness. After an internal body topology of the model is generated, the topology is traversed between wall elements to determine wall thickness.

Possible Relatives

David S Wan  Daisy Y Wan  Eugene S Wan  George S Wan  Jack G Wan  James S Wan  Jason Wan  Jun P Mendoza  Jun C Marquez  Jun D Martin 

NOTICE: You may not use PeopleBackgroundCheck or the information it provides to make decisions about employment, credit, housing or any other purpose that would require Fair Credit Reporting Act (FCRA) compliance. PeopleBackgroundCheck is not a Consumer Reporting Agency (CRA) as defined by the FCRA and does not provide consumer reports.