Keith R Epstein, Age 445 Yandow Dr, Burlington, VT 05403

Keith Epstein Phones & Addresses

5 Yandow Dr, S Burlington, VT 05403 (802) 862-7101

South Burlington, VT

599 Midline Rd, Freeville, NY 13068 (607) 539-7590

Ithaca, NY

S Burlington, VT

Mentions for Keith R Epstein

Career records & work history

License Records

Keith C Epstein

Licenses:
License #: RN1014089 - Expired
Category: NURSING
Issued Date: Aug 7, 2008
Expiration Date: Jun 30, 2010
Type: REGISTERED NURSE

Resumes & CV records

Resumes

Keith Epstein Photo 36

Owner, Engineer, Consultant

Location:
South Burlington, VT
Industry:
Mechanical Or Industrial Engineering
Work:
Forecast
Owner, Engineer, Consultant
Aeolus Labs Jun 2013 - Oct 2016
Assistant Lab Manager
Allearth Renewables, Inc. Mar 2008 - Oct 2016
Mechanical Design Engineer
Kionix, Inc. Jun 2001 - Feb 2008
Applications Engineer and Mechanical Design Engineer
Education:
Cornell University 1997 - 2001
Bachelors, Bachelor of Science, Mechanical Engineering
Skills:
Solar Energy, Mechanical Engineering, Renewable Energy, Photovoltaics, Manufacturing, Engineering, Mems, Energy Efficiency, Testing, Labview, Energy, Finite Element Analysis, Design of Experiments, Matlab, Solidworks, Civic Engagement
Languages:
English
Certifications:
Building Science Principles Certificate of Knowledge
Certified Solidworks Professional (Cswp)
Keith Epstein Photo 37

Keith Epstein

Work:
Community One Bank Na
Business Banker-Hillsborough
Keith Epstein Photo 38

Keith Epstein

Location:
United States

Publications & IP owners

Us Patents

Tri-Axis Accelerometer

US Patent:
2007011, May 31, 2007
Filed:
Nov 16, 2006
Appl. No.:
11/600175
Inventors:
Scott Adams - Ithaca NY, US
Scott Miller - Groton NY, US
Keith Epstein - Freeville NY, US
Assignee:
Kionix, Inc. - Ithaca NY
International Classification:
G01P 15/18
G01P 15/125
H01L 21/00
US Classification:
073510000, 073514320, 073514370, 438052000
Abstract:
In an embodiment of the present invention there is provided a micro-electromechanical (MEMS) accelerometer, including a substrate, a first sensor and a second sensor. The first sensor is configured to measure an acceleration along a first axis parallel to a plane of the substrate. The second sensor is configured to measure an acceleration along an axis perpendicular to the plane of the substrate. The second sensor comprises a first beam, a second beam and a single support structure. The single support structure supports the first and second beams relative to the substrate, wherein the first and second beams circumscribe the first sensor.

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