Keith KindLaguna Beach, CA

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Related to:

Roxanne Z Kind Jacob Kind Rocco Zambrano

Keith Kind Phones & Addresses

Laguna Niguel, CA

Mission Viejo, CA

Orange, CA

22271 Amber Rose, Mission Viejo, CA 92692 (949) 246-4481

Social networks

Keith Kind

Linkedin

Work

Address: 4000 Macarthur Blvd, Newport Beach, CA 92660 Specialities: Intellectual Property - 100%

Education

School / High School: North Carolina State University

Skills

Patent Litigation • Intellectual Property • Licensing • Patent Prosecution • Patents • Trade Secrets • Trademarks • Semiconductors • Prosecution • Patentability • Ic • Patent Portfolio Analysis • Copyright Law • Ip • Trademark Infringement • Registered Patent Attorney • Software Licensing

Ranks

Licence: California - Active Date: 2000

Industries

Legal Services

Mentions for Keith Kind

Career records & work history

Lawyers & Attorneys

Keith Alpert Kind, Newport Beach CA - Lawyer

Address:

4000 Macarthur Blvd, Newport Beach, CA 92660
(949) 579-3291 (Office)

Licenses:

California - Active 2000

Education:

North Carolina State University
University of North Carolina School of Law

Specialties:

Intellectual Property - 100%

Keith Kind, Mission Viejo CA - Lawyer

Office:

22271 Amber Rose, Mission Viejo, CA

ISLN:

910098715

Admitted:

1995

University:

North Carolina State University, B.S.E.E.

Law School:

University of North Carolina at Chapel Hill, J.D.

Keith Kind resumes & CV records

Resumes

Keith Kind

Industry:

Legal Services

Skills:

Patent Litigation, Intellectual Property, Licensing, Patent Prosecution, Patents, Trade Secrets, Trademarks, Semiconductors, Prosecution, Patentability, Ic, Patent Portfolio Analysis, Copyright Law, Ip, Trademark Infringement, Registered Patent Attorney, Software Licensing

Publications & IP owners

Us Patents

Method And Apparatus For Optical Probing Of Integrated Circuit Operation

US Patent:

7049632, May 23, 2006

Filed:

Dec 24, 2002

Appl. No.:

10/330798

Inventors:

Jeff R. Gemar - Superior CO, US
Mark J. Erlenborn - Naperville IL, US
George Harper - Weston MA, US
Keith A. Kind - Mission Viejo CA, US
Welborn R. Malpass - Evergreen CO, US
Sam L. Spencer - San Diego CA, US
Kewei Yang - San Jose CA, US

Assignee:

Mindspeed Technologies, Inc. - Newport Beach CA

International Classification:

H01L 23/58

US Classification:

257 48, 257 88

Abstract:

Optical transducers disposed on an integrated circuit correspond to test points thereon. The state of optical transducers perceived by an optical sensor is correlated to test points. Alignment of the optical sensor relative to the optical transducers is accomplished electronically or mechanically.

Method And Apparatus For Combined Framing And Packet Delineation

US Patent:

7327732, Feb 5, 2008

Filed:

Nov 27, 2002

Appl. No.:

10/307015

Inventors:

Mark J Erlenborn - Naperville IL, US
Jeff R. Gemar - Superior CO, US
George Harper - Weston MA, US
Kewei Yang - San Jose CA, US
Welborn R Malpass - Evergreen CO, US
Sam L Spencer - San Diego CA, US
Keith A Kind - Mission Viejo CA, US

Assignee:

Mindspeed Technologies, Inc. - Newport Beach CA

International Classification:

H04L 12/28
H04J 3/24

US Classification:

370392, 3703951, 370468, 370474

Abstract:

Incoming bit stream is processed by a single state machine into a circular buffer. Circular buffer accumulates subunits of data to form a major data unit. State machine recognizes the start of major data unit and flags the location of the major data unit in the circular buffer.

Method And Apparatus For Telemetered Probing Of Integrated Circuit Operation

US Patent:

2004011, Jun 17, 2004

Filed:

Dec 24, 2002

Appl. No.:

10/330797

Inventors:

George Harper - Weston MA, US
Mark Erlenborn - Naperville IL, US
Keith Kind - Mission Viejo CA, US
Welborn Malpass - Evergreen CO, US
Sam Spencer - San Diego CA, US
Kewei Yang - San Jose CA, US
Jeff Gemar - Superior CO, US

International Classification:

G08C019/16

US Classification:

340/870010

Abstract:

State of test points on an integrated circuit are encapsulated in a telemetry frame that is wirelessly conveyed to a test system. Test points may be logic levels or analog levels converted into representative multi-bit values. Conveyance off the circuit may be by radio frequency or optical emission.

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