Matthew M Borg, Age 5836025 Cyrus Rd NE, Albany, OR 97322

Matthew Borg Phones & Addresses

36025 Cyrus Rd NE, Albany, OR 97322 (541) 791-9038

Corvallis, OR

Windsor, CA

Santa Rosa, CA

Healdsburg, CA

Cloverdale, CA

Santa Cruz, CA

Pflugerville, TX

Austin, TX

36025 Cyrus Rd NE, Albany, OR 97322

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Work

Position: Professional/Technical

Education

Degree: High school graduate or higher

Mentions for Matthew M Borg

Publications & IP owners

Us Patents

Drive Circuit With Over-Voltage Protection For Use With Pixel Cells And Other Circuits

US Patent:
6380976, Apr 30, 2002
Filed:
Apr 25, 2000
Appl. No.:
09/558309
Inventors:
Matthew M. Borg - Corvallis OR
Assignee:
Agilent Technologies, Inc. - Palo Alto CA
International Classification:
H04N 314
US Classification:
348308
Abstract:
A drive circuit that produces an over-voltage signal and protects circuit components from the over-voltage signal (i. e. , such that circuit components operate within process specification limits). A photosensitive pixel cell can be driven by the drive circuit. Use of the drive circuit increases dynamic range of the pixel cell and reduces âghost images. â Control logic selectively passes an over-voltage signal to individual rows of a 2-D pixel array.

Pixel Sensor Column Amplifier Architecture

US Patent:
6476864, Nov 5, 2002
Filed:
May 11, 1998
Appl. No.:
09/076014
Inventors:
Matthew M. Borg - Corvallis OR
Charles E. Moore - Loveland CO
Assignee:
Agilent Technologies, Inc. - Palo Alto CA
International Classification:
H04N 964
US Classification:
348245, 348241, 348304, 348308
Abstract:
A pixel column amplifier architecture creates a reduced noise differential image signal from an pixel sensor array. The pixel column amplifier architecture comprises a first double sampling (DS) circuit and a second DS circuit that has the same configuration as the first DS circuit. An image signal containing a combination of noise components created on a substrate is coupled to the first DS circuit. A reference image signal, held in a reset state, represents the noise component of the image signal and is coupled to the second DS circuit. Further, a reference voltage source is coupled to a reference input of both the first DS and the second DS circuits. The first DS circuit provides the first side of the differential image signal, and the second DS circuit provides the second side of the differential image signal.

Ground Referenced Pixel Reset

US Patent:
7298406, Nov 20, 2007
Filed:
Jan 16, 2002
Appl. No.:
10/051739
Inventors:
Matthew M. Borg - Albany OR, US
Assignee:
Micron Technology, Inc. - Boise ID
International Classification:
H04N 3/14
H04N 5/335
H04N 5/217
US Classification:
348308, 2502081, 348296
Abstract:
A ground referenced pixel reset circuit is disclosed. The ground referenced pixel reset circuit supplies a pixel with a reset signal such that when the reset signal is asserted high, the reset signal is at a ground referenced reset voltage independent from a supply voltage. The pixel includes a photosensor, such as a photodiode, that is coupled to a ground having a same potential as the ground of the reference voltage supply. In this manner, noise caused by fluctuations in the supply voltage is reduced.

Sampling Image Signals Generated By Pixel Circuits Of An Active Pixel Sensor (Aps) Image Sensor In A Sub-Sampling Mode

US Patent:
7304674, Dec 4, 2007
Filed:
Nov 15, 2002
Appl. No.:
10/295597
Inventors:
Ray A. Mentzer - Corvallis OR, US
Matthew M. Borg - Albany OR, US
Assignee:
Avago Technologies General IP Pte Ltd - Singapore
International Classification:
H04N 3/14
US Classification:
348300, 348241, 348302, 2502081
Abstract:
A method of sampling image signals generated by pixel circuits of an active pixel sensor (APS) image sensor. The APS image sensor supports a normal mode of operation and a sub-sampling mode of operation. The method includes providing a plurality of column amplifiers. A row of pixels circuits to sample is selected. Image signals from each pixel circuit in the selected row are routed to a different one of the plurality of column amplifiers when the APS image sensor is in the normal mode of operation. Image signals from a plurality of the pixel circuits in the selected row are routed to one of the plurality of column amplifiers when the APS image sensor is in the sub-sampling mode of operation.

Analog Vertical Sub-Sampling In An Active Pixel Sensor (Aps) Image Sensor

US Patent:
7342212, Mar 11, 2008
Filed:
Mar 31, 2006
Appl. No.:
11/395193
Inventors:
Ray Allen Mentzer - Corvallis OR, US
Frank J. DeMonte - Corvallis OR, US
Jeffery Steven Beck - Philomath OR, US
Matthew Michael Borg - Albany OR, US
Charles Grant Myers - Corvallis OR, US
Assignee:
Micron Technology, Inc. - Boise ID
International Classification:
H01L 27/00
G01J 1/44
H01J 40/14
H03F 3/08
US Classification:
2502081, 250214 R, 330308, 348300, 348308
Abstract:
An active pixel sensor (APS) image sensor comprises an array of pixel circuits corresponding to rows and columns of pixels, a plurality of amplifiers that buffer signals output by the array of pixel circuits, and a plurality of sample and hold circuits that read the buffered signals. A routing mechanism is positioned between the array of pixel circuits and the plurality of amplifiers. A controller selects a set of the pixel circuits for sampling and is configured to control the routing mechanism to couple each pixel circuit in the set to a different one of the amplifiers during a normal mode of operation and to couple each pixel circuit of a subset of pixel circuits in a first set of pixel circuits to a different amplifier of a first subset of the amplifiers, to couple each pixel circuit of a subset of pixel circuits in a second set of pixel circuits to a different amplifier of a second subset of the amplifiers, and to connect the amplifiers of the first and second subsets of amplifiers in pairs to a common one of the sample and hold circuits during a sub-sampling mode of operation.

Circuit For An Active Pixel Sensor

US Patent:
7369168, May 6, 2008
Filed:
Jul 29, 2003
Appl. No.:
10/630647
Inventors:
Jeffery Steven Beck - Corvallis OR, US
Matthew Michael Borg - Albany OR, US
Assignee:
Micron Technology, Inc. - Boise ID
International Classification:
H04N 5/335
H04N 1/04
H01L 31/113
H01L 27/00
US Classification:
348308, 348294, 257291, 2502081, 358482
Abstract:
A pixel circuit includes a silicon substrate having a photodiode that converts light intensity into a voltage signal and two metal layers disposed on the substrate having a pixel control circuit. The first metal layer includes a row trace and a reset trace and the second metal layer includes a column trace and a voltage supply trace. The row trace carries a signal that activates a switch for coupling the photodiode to the column trace during a readout phase and clears the voltage at the photodiode during a reset phase. The column trace interfaces with a signal capture circuit in a CMOS array of pixels for capturing a digital image that corresponds to each voltage level at each photodiode.

Sample And Hold Circuit And Active Pixel Sensor Array Sampling System Utilizing Same

US Patent:
7388608, Jun 17, 2008
Filed:
Mar 11, 2004
Appl. No.:
10/798979
Inventors:
Jeffery Steven Beck - Corvallis OR, US
Matthew Michael Borg - Albany OR, US
Assignee:
Micron Technology, Inc. - Boise ID
International Classification:
H04N 9/64
H04N 3/14
US Classification:
348243, 348294, 348241
Abstract:
An active pixel sensor array sampling system includes a plurality of video circuits and reset circuits. A video circuit generates a video voltage from each one of the pixels of a column of pixels. An associated reset circuit generates a reset voltage for each of the pixels of a column of pixels. The video circuits and the reset circuits are closed loop sample and hold circuits. The active pixel sensor array is integrated on an integrated circuit.

Pixel With Spatially Varying Sensor Positions

US Patent:
7432491, Oct 7, 2008
Filed:
Oct 24, 2005
Appl. No.:
11/256743
Inventors:
Christopher D. Silsby - Albany OR, US
William G. Gazeley - Corvallis OR, US
Matthew M. Borg - Albany OR, US
Assignee:
Micron Technology, Inc. - Boise ID
International Classification:
H01L 31/062
US Classification:
2502081, 257291, 257184, 257187
Abstract:
An image sensor including a substrate, at least one metal layer, and a plurality of pixels arranged in array. Each pixel includes a sense element disposed in the substrate and at least one metal interconnect segment disposed in the at least one metal layer. The array includes a pair of perpendicular axes extending from an optical center, wherein for a line of pixels extending perpendicularly from one of the axes to a peripheral edge of the array a spacing between the sense elements of consecutive pairs of pixels of the line is at least equal to a spacing between the associated at least one metal interconnect segments, and wherein for at least one consecutive pair of pixels of the line the spacing between the sense elements is greater by an incremental amount than the spacing between the corresponding at least one metal interconnect segments.

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