Matthew Edward Kenyon, Age 531509 Scenic Dr, Pasadena, CA 91103

Matthew Kenyon Phones & Addresses

1509 Scenic Dr, Pasadena, CA 91103 (626) 230-4566

San Marino, CA

Springfield, OR

751 Bonita Dr, South Pasadena, CA 91030 (323) 341-5880

Washington, DC

Columbus, OH

Hyattsville, MD

Los Angeles, CA

1509 Scenic Dr, Pasadena, CA 91103

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Matthew Edward Kenyon

Linkedin

Work

Company: George mason university Aug 2012 Position: Graduate research assistant

Education

School / High School: George Mason University- Fairfax, VA 2014 Specialities: PhD in Criminology, Law, and Society

Skills

Research • Statistics

Mentions for Matthew Edward Kenyon

Matthew Kenyon resumes & CV records

Resumes

Matthew Kenyon Photo 43

Matthew Kenyon

Location:
United States
Matthew Kenyon Photo 44

Matthew Kenyon - Burke, VA

Work:
George Mason University Aug 2012 to 2000
Graduate Research Assistant
George Mason University Jul 2013 to Jul 2013
Adjunct Professor
ITT Technical Institute Mar 2011 to Aug 2012
Adjunct Professor of Criminal Justice
Roanoke City Police Department - Roanoke, VA Apr 2008 to Aug 2012
Police Officer
Radford University - Radford, VA Aug 2007 to Apr 2008
Graduate Assistant
Radford City Police Department - Radford, VA Jul 2005 to Aug 2007
Communications Officer
Education:
George Mason University - Fairfax, VA 2014
PhD in Criminology, Law, and Society
Radford University - Radford, VA 2008
Master of Arts in Criminal Justice
Radford University - Radford, VA 2007
Bachelor of Science in Criminal Justice
Stone Bridge High SChool - Ashburn, VA 2003
High School Diploma
Skills:
Research, Statistics

Publications & IP owners

Us Patents

Scanning Single Electron Transistor Microscope For Imaging Ambient Temperature Objects

US Patent:
6516281, Feb 4, 2003
Filed:
Dec 10, 1999
Appl. No.:
09/458666
Inventors:
Frederick C. Wellstood - Lanham MD
Matthew Edward Kenyon - Hyattsville MD
Christopher J. Lobb - Washington DC
Assignee:
University of Maryland - College Park MD
International Classification:
G01R 33035
US Classification:
702130, 324248, 324250
Abstract:
A system, method, and computer program product are provided for scanning objects such as computer chips. A near-field scanning Single Electron Transistor (SET) is used to detect features of the object. In particular, the SET detects variations in an electric field surrounding or emanating from the object. The variation in the field may be associated with an irregularity in the object, such as an open in the circuitry of a chip. In the case of a chip or a multi-chip module, a voltage is applied to the line containing the suspected open. If an actual open is present, the open will be manifested in an irregularity in the electric field associated with the line. The SET detects the irregularity in the field. For the SET to operate, a sufficiently cold operating temperature is maintained for the SET. A very low (cryogenic) temperature allows the use of a larger, more sensitive SET.

Mid-Wave And Long-Wave Infrared Point Spectrometer

US Patent:
2021013, May 6, 2021
Filed:
Oct 28, 2020
Appl. No.:
17/083165
Inventors:
- Pasadena CA, US
Matthew E. KENYON - Pasadena CA, US
Jordana BLACKSBERG - La Canada CA, US
Carol A RAYMOND - Pasadena CA, US
Bethany L. EHLMANN - Pasadena CA, US
Xiangwen CHEN - Pasadena CA, US
International Classification:
G01J 3/28
G01J 3/02
G01J 3/18
G01J 5/12
B64G 1/66
G02B 23/06
Abstract:
Methods and devices to implement mid-wave and long-wave infrared point spectrometers are disclosed. The described methods and devices involve bi-faceted gratings, high-operating-temperature barrier infrared and thermal detectors. The disclosed concept can be used to design flight spectrometers that cover broad solar reflectance plus thermal emission spectral ranges with a compact and low-cost instrument suitable for small spacecraft reconnaissance of asteroids, the Moon, and planetary satellites as well as mass-constrained landed missions.

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