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Nathaniel P Roman, Age 381129 Foxworth Ct, Ballwin, MO 63011

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Known as:
Nathaniel Philip Roman
Related to:
David J Roman 41 Phillip J Gungor 46

Nathaniel Roman Phones & Addresses

Ballwin, MO

Saint Louis, MO

Guthrie, OK

Yukon, OK

Mentions for Nathaniel P Roman

Nathaniel Roman resumes & CV records

Resumes

Nathaniel Roman Photo 34

Software Engineer

Location:
374 Sanchez St, San Francisco, CA 94114
Industry:
Computer Software
Work:
Stripe
Software Engineer Less Annoying Crm Oct 2013 - Oct 2015
Lead Software Engineer Facebook Aug 1, 2009 - Oct 4, 2013
Software Engineer Washington University In St. Louis 2006 - 2009
Research Assistant
Education:
Washington University In St. Louis 2005 - 2009
Bachelors, Bachelor of Science, Mathematics, Computer Science, Applied Mathematics University City Senior High
Skills:
Python, Java, Algorithms, Software Engineering, Distributed Systems, Computer Science, Scalability, Objective C, Sql, Php, Software Development, C, Javascript, Linux, Object Oriented Design, Unix
Languages:
English
Nathaniel Roman Photo 35

Nathaniel Roman

Location:
St, Louis, MO
Industry:
Aviation & Aerospace
Work:
Boeing May 2009 - Dec 2010
Electrophysics Engineer and Scientist
Education:
Oral Roberts University 2005 - 2009
Oral Roberts University;;2005 – 2009;
Skills:
Solidworks, Ansys, Finite Element Analysis, Engineering, Product Development, Mechanical Engineering, Microsoft Office, Powerpoint, Microsoft Excel, Research, Microsoft Word, Matlab, Project Management, Rf Engineering, Electromagnetics, Laboratory Skills
Nathaniel Roman Photo 36

Em Material Measurements Lab Lead

Location:
Saint Louis, MO
Work:

Em Material Measurements Lab Lead
Education:
Oral Roberts University
Nathaniel Roman Photo 37

Manager At J.p. Burgard Company

Location:
United States
Industry:
Facilities Services

Publications & IP owners

Us Patents

System And Method For Measuring Localized Characteristics Of A Transparency

US Patent:
2021012, May 6, 2021
Filed:
Nov 1, 2019
Appl. No.:
16/672363
Inventors:
- Chicago IL, US
John Joseph Haake - St. Charles MO, US
Xue Liu - Maryland Heights MO, US
Anthony Carl Roberts - St. Paul MO, US
Nathaniel Philip Roman - Ballwin MO, US
Matthew Mark Thomas - Maryland Heights MO, US
Lucian Woods - Florissant MO, US
International Classification:
B64C 1/14
B25J 19/02
G01N 21/958
G06T 7/00
Abstract:
A system includes a robotic arm of a robotic device, an imaging device coupled to the robotic arm, and a processor configured to control movement of the robotic arm to move the imaging device along a preprogrammed measurement path of a transparency while prompting the imaging device to record images of localized portions of the transparency. The processor is configured to determine one or more localized transparency characteristics based on an analysis of the images of the localized portions.

Dual Stripline Test Fixture Apparatuses And Methods

US Patent:
2019032, Oct 24, 2019
Filed:
Apr 18, 2018
Appl. No.:
15/956417
Inventors:
- CHICAGO IL, US
Nathaniel Philip Roman - Ballwin MO, US
Assignee:
THE BOEING COMPANY - CHICAGO IL
International Classification:
G01R 1/24
H01P 11/00
G05D 23/19
H01P 3/08
Abstract:
A dual stripline assembly includes a first stripline, a second stripline, and an intermediate member. The first stripline includes a first center conductor, first outer ground plane, and first inner ground plane. The first center conductor is spaced apart from and interposed between the first outer ground plane and the first inner ground plane. The first stripline extends along a length of the assembly. The second stripline includes a second center conductor, second outer ground plane, and second inner ground plane. The second center conductor is spaced apart from and interposed between the second outer ground plane and the second inner ground plane. The second stripline extends along the length of the assembly. The intermediate member extends along the length of the assembly, and includes the first inner ground plane and the second inner ground plane.

Probe Calibration Devices And Methods

US Patent:
2017008, Mar 23, 2017
Filed:
Jun 11, 2015
Appl. No.:
14/737229
Inventors:
- Chicago IL, US
Nathaniel P. Roman - Ballwin MO, US
International Classification:
G01R 35/00
G01R 3/00
G01R 23/165
Abstract:
A probe calibration device that includes a first offset element having a substantially rectangular first aperture. The probe calibration device includes a tuned pass element disposed adjacent to the first offset element. The tuned pass element has a non-rectangular second aperture. The probe calibration device includes a second offset element disposed adjacent to the tuned pass element and on a side opposite the first offset element. The second offset element has a substantially rectangular third aperture. The probe calibration device includes a backing element disposed adjacent to the second offset element. The first offset element, the tuned pass element, the second offset element and the backing element form a cavity.

Possible Relatives

Cynthia E Roman  Dean J Roman  Daisy A Roman  Debbie L Roman  Damien A Roman  Daniel P Roman  Deisy Roman  Nathaniel D White  Nathaniel A Jolly  Nathaniel J Stanton 

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