Patrick D Hughes, Age 66220 Mar Vista Dr SPC 101, Aptos, CA 95003

2016032, Nov 10, 2016

May 6, 2015

14/705546

- San Diego CA, US
Govindarajan Krishnamurthi - Palo Alto CA, US
Mihai Christodorescu - San Jose CA, US
Rajarshi Gupta - Sunnyvale CA, US
Vinay Sridhara - Santa Clara CA, US
Patrick Hughes - Dana Point CA, US

G01R 29/08
G01R 31/00

Systems, methods, and devices of the various aspects enable detecting anomalous electromagnetic (EM) emissions from among a plurality of electronic devices. A device processor may receive EM emissions of a plurality of electronic devices, wherein the receiving device has no previous information about any of the plurality of electronic devices. The device processor may cross-correlate the EM emissions of the plurality of electronic devices over time. The device processor may identify a difference of the cross-correlated EM emissions from earlier cross-correlated EM emissions. The device processor may determine that the difference of the cross-correlated EM emissions from the earlier cross-correlated EM emissions indicates an anomaly in one or more of the plurality of electronic devices.

2016024, Aug 18, 2016

Feb 12, 2015

14/620341

- San Diego CA, US
Govindarajan Krishnamurthi - Palo Alto CA, US
Rajarshi Gupta - Sunnyvale CA, US
Mihai Christodorescu - San Jose CA, US
Vinay Sridhara - Santa Clara CA, US
Patrick Hughes - Dana Point CA, US

H04W 24/08
H04W 64/00
H04B 15/00
H04W 4/02

Systems, methods, and devices of the various aspects enable detecting a malfunction caused by radio frequency (RF) interference. A computing device processor may identify a location of the computing device based on a plurality of real-time data inputs received by the computing device. The processor may characterize an RF environment of the computing device based on the identified location and the plurality of real-time data inputs. The processor may determine at least one RF emissions threshold based on the characterization of the RF environment. The processor may compare the characterization of the RF environment to the at least one RF emissions threshold, and may perform an action in response to determining that the characterization of the RF environment exceeds the at least one RF emissions threshold.