Inventors:
Ronald N. Parente - Bolton MA
Paul Boyd - Oak Creek WI
David F. Botros - Burlington MA
Peter K. Lison - Methuen MA
Assignee:
Nortel Networks, Ltd. - St. Laurent
International Classification:
G01N 2100
Abstract:
A novel method and apparatus has been developed for testing optical circuit modules. More particularly, with the present invention, a given test pack is adapted to âsimultaneouslyâ test a plurality of DUTs, by simultaneously apply a given optical signal to each of the plurality of DUTs and allowing each of the DUTs to simultaneously undergo its own testing; the test pack then serially queries each of the DUTs to obtain test results and, if desired, can provide feedback to one or more of the DUTs, whereby the DUTs can be calibrated with the assistance of the test pack. In one preferred form of the invention, all of the plurality of DUTs simultaneously undergoing testing on a given test pack are housed in a single environmental enclosure, permitting all of the DUTs to be simultaneously brought âup to temperatureâ so as to increase testing throughput.