Philip A Trask549 Swarthmore Ave, Pacific Palisades, CA 90272

Philip Trask Phones & Addresses

549 Swarthmore Ave, Pacific Plsds, CA 90272

Pacific Palisades, CA

Santa Monica, CA

Los Angeles, CA

Languages

English

Mentions for Philip A Trask

Career records & work history

Medicine Doctors

Philip Trask Photo 1

Dr. Philip A Trask, Pacific Palisades CA - DDS (Doctor of Dental Surgery)

Specialties:
Pediatric Dentistry
Address:
881 Alma Real Dr Suite 315, Pacific Palisades, CA 90272
(310) 459-3088 (Phone) (310) 454-9555 (Fax)
Languages:
English

Philip Trask resumes & CV records

Resumes

Philip Trask Photo 33

Associate At Home Depot

Position:
associate at Home Depot
Location:
Greater Los Angeles Area
Industry:
Electrical/Electronic Manufacturing
Work:
Home Depot
associate
Education:
University of California, Los Angeles 1965 - 1969
Philip Trask Photo 34

Philip Trask

Location:
United States

Publications & IP owners

Us Patents

Phase Mask Laser Fabrication Of Fine Pattern Electronic Interconnect Structures

US Patent:
5827775, Oct 27, 1998
Filed:
Nov 12, 1997
Appl. No.:
8/968378
Inventors:
Robert S. Miles - Monrovia CA
Philip A. Trask - Laguna Hills CA
Vincent A. Pillai - Irvine CA
Assignee:
Raytheon Comapny - Lexington MA
International Classification:
H01L 2128
US Classification:
438622
Abstract:
Phase mask laser machining procedures for fabricating high density fine pattern feature electrical interconnection structures. Conductor patterns are fabricated using a phase mask laser patterned dielectric layer as a conductor wet etch masking layer, or by subtractively removing metal using holographic phase mask laser micromachining. In accordance with the present invention, a substrate is provided, a first layer of dielectric material is formed on the substrate, a metal layer is formed on the first layer of dielectric material, and a second layer of dielectric material is then formed on the metal layer. A phase mask is disposed above the second layer of dielectric material that has a predefined phase pattern therein defining a metal conductor pattern that corresponds to an interconnect structure. The second layer of dielectric material is then processed using the phase mask to form the interconnect structure. In a first procedure, the second layer of dielectric material is irradiated through the phase mask using laser energy to remove portions of the second layer of dielectric material and expose the metal layer to define the metal conductor pattern and to provide a dielectric etch mask.

Methods Of Forming Two-Sided Hdmi Interconnect Structures

US Patent:
5691245, Nov 25, 1997
Filed:
Oct 28, 1996
Appl. No.:
8/738558
Inventors:
Gabriel G. Bakhit - Huntington Beach CA
Vincent A. Pillai - Irvine CA
George Averkiou - Upland CA
Philip A. Trask - Laguna Hills CA
Assignee:
HE Holdings, Inc. - Los Angeles CA
International Classification:
H01L 2160
US Classification:
437209
Abstract:
Methods of forming two-sided high density multilayer interconnect (HDMI) structures on a relatively large carrier and subsequently releasing and removing one or more structures to provide useable flexible interconnects or decals. In general, a carrier is provided and a release layer is formed on the carrier. Flexible high density multilayer interconnect structures are fabricated on the release layer. The release layer is processed to release and remove one or more flexible HDMI structures from the carrier. The carrier may be an ultraviolet transparent substrate, such as quartz, for example, and the release layer may be a polyimide layer. The HDMI structures are released by irradiating the release layer through the transparent carrier using ultraviolet radiation from an ultraviolet radiation source. Alternatively, a silicon carrier may be used that has a metal or silicon dioxide release layer formed thereon. The HDMI structures are released from the metal or silicon dioxide release layer by using wet etching procedures.

Phase Mask Laser Fabrication Of Fine Pattern Electronic Interconnect Structures

US Patent:
5840622, Nov 24, 1998
Filed:
Aug 27, 1996
Appl. No.:
8/703854
Inventors:
Robert S. Miles - Monrovia CA
Philip A. Trask - Laguna Hills CA
Vincent A. Pillai - Irvine CA
Assignee:
Raytheon Company - Lexington MA
International Classification:
H01L 2128
US Classification:
438622
Abstract:
Phase mask laser machining procedures for fabricating high density fine pattern feature electrical interconnection structures. Conductor patterns are fabricated using a phase mask laser patterned dielectric layer as a conductor wet etch masking layer, or by subtractively removing metal using holographic phase mask laser micromachining. In accordance with the present invention, a substrate is provided, a first layer of dielectric material is formed on the substrate, a metal layer is formed on the first layer of dielectric material, and a second layer of dielectric material is then formed on the metal layer. A phase mask is disposed above the second layer of dielectric material that has a predefined phase pattern therein defining a metal conductor pattern that corresponds to an interconnect structure. The second layer of dielectric material is then processed using the phase mask to form the interconnect structure. In a first procedure, the second layer of dielectric material is irradiated through the phase mask using laser energy to remove portions of the second layer of dielectric material and expose the metal layer to define the metal conductor pattern and to provide a dielectric etch mask.

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