People Background Check
Find People:

Shaun S Gleason, Age 5812309 Mallard Bay Dr, Knoxville, TN 37922

Get Report
Known as:
Shaun A Gleason Shawn Gleason Shauna Gleason
Related to:
Rachael V Gleason 39

Shaun Gleason Phones & Addresses

12309 Mallard Bay Dr, Knoxville, TN 37922 (865) 621-1348

655 Brochardt Blvd, Concord, TN 37922 (865) 675-3772

12705 Red Canyon Rd, Concord, TN 37922 (865) 675-3772

Farragut, TN

Lenoir City, TN

Loudon, TN

Oak Ridge, TN

12705 Red Canyon Rd, Knoxville, TN 37934 (865) 621-1348

Show more

Work

Position: Building and Grounds Cleaning and Maintenance Occupations

Education

Degree: Bachelor's degree or higher

Mentions for Shaun S Gleason

Shaun Gleason resumes & CV records

Resumes

Shaun Gleason Photo 21

Director, Cyber And Applied Data Analytics Division

Location:
Knoxville, TN
Industry:
Research
Work:
Oak Ridge National Laboratory
Director, Cyber and Applied Data Analytics Division Oak Ridge National Laboratory Jul 2013 - Sep 2018
Director, Computational Sciences and Engineering Division Oak Ridge National Laboratory Oct 2011 - Jul 2013
Director, Office of Institutional Planning Oak Ridge National Laboratory Jun 2008 - Oct 2011
Group Leader Siemens Medical Solutions Molecular Imaging 2006 - 2008
Director, Preclinical R and D Siemens 2004 - 2006
Director Imtek Jan 1998 - Nov 2004
Vice President and Co-Founder
Education:
University of Tennessee, Knoxville 1997 - 2001
Doctorates, Doctor of Philosophy, Electrical Engineering
Skills:
R&D, Signal Processing, Medical Imaging, Medical Devices, Computer Vision, Science, Machine Learning, Digital Imaging, X Ray, Leadership, Image Processing, Algorithms, Optics, Biomedical Engineering, Product Development, Software Development, Strategy, Sensors, Embedded Systems, Electronics, High Performance Computing, Systems Engineering, Microscopy, Electrical Engineering, Business Planning, Labview, Research and Development
Interests:
Medical Imaging
Computer Vision
Shaun Gleason Photo 22

Shaun Gleason

Publications & IP owners

Us Patents

Automatic Detection Of Bone Fragments In Poultry Using Multi-Energy X-Rays

US Patent:
6370223, Apr 9, 2002
Filed:
Apr 6, 2001
Appl. No.:
09/827876
Inventors:
Shaun S. Gleason - Knoxville TN
Michael J. Paulus - Knoxville TN
James A. Mullens - Knoxville TN
Assignee:
UT-Battelle, LLC - Oak Ridge TN
International Classification:
G01B 1506
US Classification:
378 58, 378 54
Abstract:
At least two linear arrays of x-ray detectors are placed below a conveyor belt in a poultry processing plant. Multiple-energy x-ray sources illuminate the poultry and are detected by the detectors. Laser profilometry is used to measure the poultry thickness as the x-ray data is acquired. The detector readout is processed in real time to detect the presence of small highly attenuating fragments in the poultry, i. e. , bone, metal, and cartilage.

Ultra-High Resolution Computed Tomography Imaging

US Patent:
6421409, Jul 16, 2002
Filed:
Feb 2, 2000
Appl. No.:
09/496879
Inventors:
Michael J. Paulus - Knoxville TN
Hamed Sari-Sarraf - Knoxville TN
Shaun S. Gleason - Knoxville TN
Assignee:
UT-Battelle LLC - Oak Ridge TN
International Classification:
A61B 603
US Classification:
378 4, 378901
Abstract:
A method for ultra-high resolution computed tomography imaging, comprising the steps of: focusing a high energy particle beam, for example x-rays or gamma-rays, onto a target object; acquiring a 2-dimensional projection data set representative of the target object; generating a corrected projection data set by applying a deconvolution algorithm, having an experimentally determined a transfer function, to the 2-dimensional data set; storing the corrected projection data set; incrementally rotating the target object through an angle of approximately 180Â, and after each the incremental rotation, repeating the radiating, acquiring, generating and storing steps; and, after the rotating step, applying a cone-beam algorithm, for example a modified tomographic reconstruction algorithm, to the corrected projection data sets to generate a 3-dimensional image. The size of the spot focus of the beam is reduced to not greater than approximately 1 micron, and even to not greater than approximately 0. 5 microns.

Context-Based Automated Defect Classification System Using Multiple Morphological Masks

US Patent:
6456899, Sep 24, 2002
Filed:
Dec 7, 1999
Appl. No.:
09/454568
Inventors:
Shaun S. Gleason - Knoxville TN
Martin A. Hunt - Knoxville TN
Hamed Sari-Sarraf - Lubbock TX
Assignee:
UT-Battelle, LLC - Oak Ridge TN
International Classification:
G06F 1900
US Classification:
700212, 700110, 706900
Abstract:
Automatic detection of defects during the fabrication of semiconductor wafers is largely automated, but the classification of those defects is still performed manually by technicians. This invention includes novel digital image analysis techniques that generate unique feature vector descriptions of semiconductor defects as well as classifiers that use these descriptions to automatically categorize the defects into one of a set of pre-defined classes. Feature extraction techniques based on multiple-focus images, multiple-defect mask images, and segmented semiconductor wafer images are used to create unique feature-based descriptions of the semiconductor defects. These feature-based defect descriptions are subsequently classified by a defect classifier into categories that depend on defect characteristics and defect contextual information, that is, the semiconductor process layer(s) with which the defect comes in contact. At the heart of the system is a knowledge database that stores and distributes historical semiconductor wafer and defect data to guide the feature extraction and classification processes. In summary, this invention takes as its input a set of images containing semiconductor defect information, and generates as its output a classification for the defect that describes not only the defect itself, but also the location of that defect with respect to the semiconductor process layers.

Method For Non-Referential Defect Characterization Using Fractal Encoding And Active Contours

US Patent:
7218772, May 15, 2007
Filed:
Jun 10, 2002
Appl. No.:
10/166296
Inventors:
Shaun S. Gleason - Knoxville TN, US
Hamed Sari-Sarraf - Lubbock TX, US
Assignee:
Ut-Battelle LLC - Oak Ridge TN
International Classification:
G06K 9/00
US Classification:
382149, 382141, 382145, 382147, 382232, 382249, 700110, 702 35
Abstract:
A method for identification of anomalous structures, such as defects, includes the steps of providing a digital image and applying fractal encoding to identify a location of at least one anomalous portion of the image. The method does not require a reference image to identify the location of the anomalous portion. The method can further include the step of initializing an active contour based on the location information obtained from the fractal encoding step and deforming an active contour to enhance the boundary delineation of the anomalous portion.

System And Method For Generating Motion Corrected Tomographic Images

US Patent:
8170302, May 1, 2012
Filed:
Sep 30, 2005
Appl. No.:
11/241359
Inventors:
Shaun S. Gleason - Knoxville TN, US
Assignee:
UT-Battelle, LLC - Oak Ridge TN
International Classification:
G06K 9/00
A61B 6/00
US Classification:
382128, 378 4, 382131
Abstract:
A method and related system for generating motion corrected tomographic images includes the steps of illuminating a region of interest (ROI) to be imaged being part of an unrestrained live subject and having at least three spaced apart optical markers thereon. Simultaneous images are acquired from a first and a second camera of the markers from different angles. Motion data comprising 3D position and orientation of the markers relative to an initial reference position is then calculated. Motion corrected tomographic data obtained from the ROI using the motion data is then obtained, where motion corrected tomographic images obtained therefrom.

Quantitative Phase-Imaging Systems

US Patent:
8248614, Aug 21, 2012
Filed:
Mar 16, 2009
Appl. No.:
12/405063
Inventors:
Christopher J. Mann - Knoxville TN, US
Philip R. Bingham - Knoxville TN, US
Shaun S. Gleason - Knoxville TN, US
Assignee:
UT-Battelle, LLC - Oak Ridge TN
International Classification:
G01B 9/02
US Classification:
356485
Abstract:
An optical system performs imaging in a transmissive and reflective mode. The system includes an optical interferometer that generates interference phenomena between optical waves to measure multiple distances, thicknesses, and indices of refraction of a sample. Measurements are made through a galvanometer that scans a pre-programmed angular arc. An excitation-emission device allows an electromagnetic excitation and emission to pass through an objective in optical communication with the sample. An electromagnetic detector receives the output of the optical interferometer and the excitation-emission device to render a magnified three dimensional image of the sample.

Imaging System Warp Correction With Phantom Assembly

US Patent:
2013010, Apr 25, 2013
Filed:
Oct 15, 2012
Appl. No.:
13/651590
Inventors:
SIEMENS MEDICAL SOLUTIONS USA, INC. - Malvern PA, US
Sam Griffin - New Taxewell TN, US
Shaun Gleason - Knoxville TN, US
Ziad Burbar - Knoxville TN, US
Assignee:
SIEMENS MEDICAL SOLUTIONS USA, INC. - Malvern PA
International Classification:
H04N 5/217
US Classification:
348375, 348E05078
Abstract:
A device for imaging system warp correction includes an object including an imaging phantom, the object being configured for placement of the imaging phantom adjacent a scanning interface of a detector, and a mounting cap coupled to the object and configured to be secured to the detector to establish the placement of the imaging phantom adjacent the scanning interface of the detector. The mounting cap includes a plurality of alignment features configured to align the object and the mounting cap.

Automated Defect Spatial Signature Analysis For Semiconductor Manufacturing Process

US Patent:
5982920, Nov 9, 1999
Filed:
Jan 8, 1997
Appl. No.:
8/780569
Inventors:
Kenneth W. Tobin - Harriman TN
Shaun S. Gleason - Knoxville TN
Thomas P. Karnowski - Knoxville TN
Hamed Sari-Sarraf - Knoxville TN
Assignee:
Lockheed Martin Energy Research Corp. Oak Ridge National Laboratory - Oak Ridge TN
International Classification:
G06K 900
US Classification:
382145
Abstract:
An apparatus and method for performing automated defect spatial signature alysis on a data set representing defect coordinates and wafer processing information includes categorizing data from the data set into a plurality of high level categories, classifying the categorized data contained in each high level category into user-labeled signature events, and correlating the categorized, classified signature events to a present or incipient anomalous process condition.

Possible Relatives

Debbie L Gleason  Debra H Gleason  Aaron R Gleason  Denise A Gleason  Dianne M Gleason  Donald M Gleason  Dustin V Gleason  Shaun J Johnston  Shaun A Stapleton  Shaun D Starnes 

NOTICE: You may not use PeopleBackgroundCheck or the information it provides to make decisions about employment, credit, housing or any other purpose that would require Fair Credit Reporting Act (FCRA) compliance. PeopleBackgroundCheck is not a Consumer Reporting Agency (CRA) as defined by the FCRA and does not provide consumer reports.