Steven J Chacko, Age 57470 Cedar Hill Dr, San Rafael, CA 94903

Steven Chacko Phones & Addresses

470 Cedar Hill Dr, San Rafael, CA 94903 (415) 507-0650

Cottonwood Heights, UT

Encinitas, CA

Salt Lake City, UT

2300 Arrowhead Dr, Oakland, CA 94611

Piedmont, CA

Mill Valley, CA

Sausalito, CA

Novato, CA

Marina, CA

470 Cedar Hill Dr, San Rafael, CA 94903 (415) 380-1840

Show more

Work

Company: Furaxa, inc Address: 34 Canyon View Dr, Orinda, CA 94563 Phones: (925) 253-2969 Position: Vice president engineering and co-founder Industries: Instruments for Measuring and Testing of Electricity and Electrical Signals

Education

Degree: High school graduate or higher

Mentions for Steven J Chacko

Publications & IP owners

Us Patents

Method And Apparatus For Measuring D.c. And A.c. Voltages Using Non-Contacting Sensors

US Patent:
6452398, Sep 17, 2002
Filed:
Nov 8, 2000
Appl. No.:
09/707781
Inventors:
Joel Libove - Orinda CA, 94563
Steven Chacko - Novato CA, 94945
Jerome Singer - Berkeley CA, 94705
International Classification:
G01R 1506
US Classification:
324457, 324126, 324539
Abstract:
An apparatus for performing non-contacting measurements of the voltage of a conductor includes a conducting membrane coupled to a transducer. The membrane is driven with an A. C. reference voltage, creating alternating attractive and repulsive electrostatic forces caused by the difference in potential between the membrane and the conductor. The transducer generates a signal having the same frequencies as the forces on the membrane, and the amplitudes of the A. C. components are proportional to the unknown voltage on the conductor. By dividing the amplitude of the A. C. components, an accurate determination of the unknown voltage is calculated A plurality of membranes and transducers may be arrayed to provide an image of multiple voltage readings. In addition, it is also possible to measure A. C. and D. C. voltage on the center conductor of an insulated wire without the need to pierce the insulation.

Methods And Apparatuses For Multiple Sampling And Multiple Pulse Generation

US Patent:
6642878, Nov 4, 2003
Filed:
Aug 13, 2002
Appl. No.:
10/218860
Inventors:
Joel M. Libove - Orinda CA
Steven J. Chacko - Mill Valley CA
Assignee:
Furaxa, Inc. - Orinda CA
International Classification:
H03M 166
US Classification:
341144, 341145
Abstract:
A method and apparatus for generating multiple ultra-fast (picosecond-range) electrical sampling apertures and pulses in response to a slewed control signal is disclosed. In one embodiment a series or sequence of sampling apertures are formed for sampling an input signal without the use of delay lines. In another embodiment, the input to be sampled is incrementally delayed to generate signals along a delay line. The delayed signals are simultaneously sampled in a sampling window to obtain a group of samples of an input signal at the same time. In another embodiment, a series or sequence of ultra-fast pulses are formed in an output signal without using delay lines. Parallel and serial sampler/pulser circuitry are disclosed.

Methods, Apparatuses, And Systems For Sampling Or Pulse Generation

US Patent:
6433720, Aug 13, 2002
Filed:
Jun 6, 2001
Appl. No.:
09/876016
Inventors:
Joel M. Libove - Orinda CA
Steven J. Chacko - Oakland CA
Assignee:
Furaxa, Inc. - Orinda CA
International Classification:
H03M 166
US Classification:
341144, 341145
Abstract:
A method and apparatus for generating ultra-fast (picosecond-range) electrical sampling apertures and pulses, requiring only a single transition of a control signal, is disclosed. Implemented in a novel circuit architecture that is suited to fabrication as a low-cost monolithic integrated circuit, the method produces more stable, more reproducible, and more precisely shaped sampling apertures and pulses, with lower power usage and cost, than conventional techniques. The combination of speed and reproducibility enabled by the invention allows the integration of large numbers of virtually identical fast sampling apertures or pulse generators on a single IC, enabling single-shot capture of such a rapid sequence of samples that even a single cycle of a very fast, microwave frequency, electronic waveform may be precisely sampled at multiple points.

NOTICE: You may not use PeopleBackgroundCheck or the information it provides to make decisions about employment, credit, housing or any other purpose that would require Fair Credit Reporting Act (FCRA) compliance. PeopleBackgroundCheck is not a Consumer Reporting Agency (CRA) as defined by the FCRA and does not provide consumer reports.