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Van C Huynh, Age 5713926 Charterhouse Way, Sugar Land, TX 77498

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Known as:
Van Cam Huynh Vanh C Huynh Vanc Huynh Dan C Huynh Van M Cao Van C Luong Vancam Huynh Huynh C Van Huynh Vancam
Related to:
Lam T Tran 56

Van Huynh Phones & Addresses

13926 Charterhouse Way, Sugar Land, TX 77498

11122 Sands Point Dr, Houston, TX 77072

11115 Bellerive Dr, Houston, TX 77072 (281) 530-6882

2018 Londonderry Dr, Allen, TX 75013 (972) 359-9731

601 Renner Rd, Richardson, TX 75080 (972) 808-0521

Plano, TX

Mentions for Van C Huynh

Career records & work history

Lawyers & Attorneys

Van Huynh Photo 1

Van Huynh

Medicine Doctors

Van Huynh

Specialties:
Internal Medicine
Work:
Vancouver Clinic
700 NE 87 Ave, Vancouver, WA 98664
(360) 882-2778 (phone) (360) 604-1785 (fax)
Site
Education:
Medical School
Tufts University School of Medicine
Graduated: 1997
Procedures:
Allergen Immunotherapy, Arthrocentesis, Destruction of Benign/Premalignant Skin Lesions, Electrocardiogram (EKG or ECG), Skin Tags Removal, Vaccine Administration
Conditions:
Abnormal Vaginal Bleeding, Acne, Acute Bronchitis, Acute Sinusitis, Anemia, Anxiety Dissociative and Somatoform Disorders, Bronchial Asthma, Cholelethiasis or Cholecystitis, Chronic Bronchitis, Chronic Renal Disease, Constipation, Dermatitis, Disorders of Lipoid Metabolism, Gastroesophageal Reflux Disease (GERD), Hearing Loss, Heart Failure, Hemorrhoids, Hypertension (HTN), Hyperthyroidism, Hypothyroidism, Infectious Liver Disease, Intervertebral Disc Degeneration, Iron Deficiency Anemia, Ischemic Heart Disease, Lateral Epicondylitis, Menopausal and Postmenopausal Disorders, Migraine Headache, Non-Toxic Goiter, Osteoarthritis, Osteoporosis, Otitis Media, Peripheral Nerve Disorders, Plantar Fascitis, Spinal Stenosis, Tempromandibular Joint Disorders (TMJ), Tinea Unguium, Urinary Incontinence, Vitamin D Deficiency, Abdominal Hernia, Acute Conjunctivitis, Acute Myocardial Infarction (AMI), Acute Pancreatitis, Acute Pharyngitis, Acute Renal Failure, Acute Upper Respiratory Tract Infections, Alopecia Areata, Alzheimer's Disease, Anal Fissure, Anxiety Phobic Disorders, Aortic Valvular Disease, Arterial Thromboembolic Disease, Atherosclerosis, Atrial Fibrillation and Atrial Flutter, Bell's Palsy, Benign Paroxysmal Positional Vertigo, Benign Polyps of the Colon, Benign Prostatic Hypertrophy, Benign Thyroid Diseases, Bipolar Disorder, Burns, Calculus of the Urinary System, Candidiasis, Cardiac Arrhythmia, Cardiomyopathy, Carpel Tunnel Syndrome, Cataract, Cirrhosis, Congenital Anomalies of the Heart, Contact Dermatitis, Dementia, Depressive Disorders, Diabetes Mellitus (DM), Diabetic Peripheral Neuropathy, Diverticulitis, Emphysema, Endometriosis, Epilepsy, Erectile Dysfunction (ED), Esophagitis, Fractures, Dislocations, Derangement, and Sprains, Gastritis and Duodenitis, Gastrointestinal Hemorrhage, Genital HPV, Glaucoma, Gout, Hallux Valgus, Hemorrhagic stroke, Herpes Genitalis, Herpes Simplex, Herpes Zoster, Hypoparathyroidism, Inguinal Hernia, Insomnia, Internal Derangement of Knee Cartilage, Intestinal Obstruction, Irritable Bowel Syndrome (IBS), Ischemic Bowel Disease, Ischemic Stroke, Malignant Neoplasm of Female Breast, Melanoma, Mitral Valvular Disease, Multiple Sclerosis (MS), Myasthenia Gravis (MG), Obstructive Sleep Apnea, Osteomyelitis, Overweight and Obesity, Parkinson's Disease, Phlebitis and Thrombophlebitis, Plantar Warts, Pneumonia, Polycystic Ovarian Syndrome (PCOS), Premenstrual Syndrome (PMS), Psoriasis, Pulmonary Embolism, Raynaud's Disease, Restless Leg Syndrome, Rheumatoid Arthritis, Rosacea, Sciatica, Septicemia, Sexually Transmitted Diseases (STDs), Skin and Subcutaneous Infections, Skin Cancer, Substance Abuse and/or Dependency, Systemic Lupus Erythematosus, Tension Headache, Tinea Pedis, Transient Cerebral Ischemia, Urinary Tract Infection (UT), Varicose Veins, Venous Embolism and Thrombosis, Ventral Hernia
Languages:
English, Korean, Russian, Spanish
Description:
Dr. Huynh graduated from the Tufts University School of Medicine in 1997. She works in Vancouver, WA and specializes in Internal Medicine. Dr. Huynh is affiliated with Legacy Salmon Creek Medical Center and PeaceHealth Southwest Medical Center.

License Records

Van Tuyet Huynh

Address:
6911 Martin Luther King Blvd STE 1, Houston, TX 77033
Phone:
(713) 412-0623
Licenses:
License #: 1101143 - Active
Category: Cosmetology Manicurist
Expiration Date: Oct 24, 2018

Van Thai Huynh

Address:
3707 Kristin Lee Ln, Houston, TX 77014
Phone:
(832) 212-3656
Licenses:
License #: 1142637 - Active
Category: Cosmetology Manicurist
Expiration Date: Jul 31, 2017

Van Thai Huynh

Address:
3707 Kristin Lee Ln, Houston, TX 77014
Phone:
(832) 212-3656
Licenses:
License #: 1216796 - Active
Category: Cosmetology Esthetician
Expiration Date: Aug 12, 2017

Van Huynh

Address:
9215 Daisy Cv Ln, Houston, TX 77064
Phone:
(832) 641-4911
Licenses:
License #: 1246108 - Active
Category: Cosmetology Manicurist
Expiration Date: Apr 30, 2018

Van Cam Huynh

Address:
6646 Brownie Campbell Rd, Houston, TX 77086
Phone:
(281) 683-8430
Licenses:
License #: 1270362 - Expired
Category: Cosmetology Manicurist
Expiration Date: Aug 31, 2016

Van Cam Huynh

Address:
6646 Brownie Campbell Rd, Houston, TX 77086
Phone:
(281) 683-8430
Licenses:
License #: 1285116 - Expired
Category: Cosmetology Esthetician
Expiration Date: Aug 31, 2016

Van Thi Huynh

Address:
10034 Easthaven Blvd, Houston, TX 77075
Phone:
(832) 367-8539
Licenses:
License #: 1286468 - Active
Category: Cosmetology Operator
Expiration Date: Oct 24, 2017

Van Huynh

Address:
8610 Gln Vly Dr, Houston, TX 77061
Phone:
(832) 865-1711
Licenses:
License #: 1447686 - Active
Category: Cosmetology Manicurist
Expiration Date: Jul 16, 2017

Publications & IP owners

Us Patents

Memory Device Tester And Method For Testing Reduced Power States

US Patent:
6418070, Jul 9, 2002
Filed:
Sep 2, 1999
Appl. No.:
09/388566
Inventors:
Matthew R. Harrington - Carrollton TX
Van C. Huynh - Richardson TX
Adin E. Hyslop - Richardson TX
Assignee:
Micron Technology, Inc. - Boise ID
International Classification:
G11C 700
US Classification:
365201, 365226, 365229, 365228, 714 21, 714 22
Abstract:
A memory device tester capable of testing for proper operation of reduced power states in memory devices. The memory device tester can include a processor or a state machine, each configured to send commands to the memory device, and to compare results. An example of a memory device that can be tested by the memory device tester is a Direct Rambus Dynamic Random Access Memory (DRDRAM). The described processing systems and other circuits can test a DRDRAM for proper operation in a standby (STBY) state. When the DRDRAM is in STBY, the column decoder is shut off to conserve power, and the DRDRAM should not respond to column packets on the column control bus. The DRDRAM Specification suggests that the DRDRAM be put in the STBY state with no banks active. The method and apparatus provide for testing that the column decoder is shut off when in STBY with no banks active, which is the recommended usage pattern for the part.

Memory Device Tester And Method For Testing Reduced Power States

US Patent:
6674677, Jan 6, 2004
Filed:
Jun 12, 2002
Appl. No.:
10/166887
Inventors:
Matthew R. Harrington - Carrollton TX
Van C. Huynh - Richardson TX
Adin E. Hyslop - Richardson TX
Assignee:
Micron Technology, Inc. - Boise ID
International Classification:
G11C 700
US Classification:
365201, 365227, 365228, 36523006
Abstract:
A memory device tester capable of testing for proper operation of reduced power states in memory devices. The memory device tester can include a processor or a state machine, each configured to send commands to the memory device, and to compare results. An example of a memory device that can be tested by the memory device tester is a Direct Rambus Dynamic Random Access Memory (DRDRAM). The described processing systems and other circuits can test a DRDRAM for proper operation in a standby (STBY) state. When the DRDRAM is in STBY, the column decoder is shut off to conserve power, and the DRDRAM should not respond to column packets on the column control bus. The method and apparatus provide for testing that the column decoder is shut off when in STBY with no banks active, which is the recommended usage pattern for the part.

Memory Device Tester And Method For Testing Reduced Power States

US Patent:
6775192, Aug 10, 2004
Filed:
Jun 12, 2002
Appl. No.:
10/167817
Inventors:
Matthew R. Harrington - Carrollton TX
Van C. Huynh - Richardson TX
Adin E. Hyslop - Richardson TX
Assignee:
Micron Technology, Inc. - Boise ID
International Classification:
G11C 700
US Classification:
365201, 365226, 365229, 365228, 36518907, 714 21, 714 22
Abstract:
A memory device tester capable of testing for proper operation of reduced power states in memory devices. The memory device tester can include a processor or a state machine, each configured to send commands to the memory device, and to compare results. An example of a memory device that can be tested by the memory device tester is a Direct Rambus Dynamic Random Access Memory (DRDRAM). The described processing systems and other circuits can test a DRDRAM for proper operation in a standby (STBY) state. When the DRDRAM is in STBY, the column decoder is shut off to conserve power, and the DRDRAM should not respond to column packets on the column control bus. The method and apparatus provide for testing that the column decoder is shut off when in STBY with no banks active, which is the recommended usage pattern for the part.

Memory Device Tester And Method For Testing Reduced Power States

US Patent:
6914843, Jul 5, 2005
Filed:
Jun 12, 2002
Appl. No.:
10/170561
Inventors:
Matthew R. Harrington - Carrollton TX, US
Van C. Huynh - Richardson TX, US
Adin E. Hyslop - Richardson TX, US
Assignee:
Micron Technology, Inc. - Boise ID
International Classification:
G11C007/00
US Classification:
365227, 365201, 365226
Abstract:
A memory device tester capable of testing for proper operation of reduced power states in memory devices. The memory device tester can include a processor or a state machine, each configured to send commands to the memory device, and to compare results. An example of a memory device that can be tested by the memory device tester is a Direct Rambus Dynamic Random Access Memory (DRDRAM). The described processing systems and other circuits can test a DRDRAM for proper operation in a standby (STBY) state. When the DRDRAM is in STBY, the column decoder is shut off to conserve power, and the DRDRAM should not respond to column packets on the column control bus. The method and apparatus provide for testing that the column decoder is shut off when in STBY with no banks active, which is the recommended usage pattern for the part.

Memory Device Tester And Method For Testing Reduced Power States

US Patent:
7161866, Jan 9, 2007
Filed:
Jul 1, 2005
Appl. No.:
11/173307
Inventors:
Matthew R. Harrington - Carrollton TX, US
Van C. Huynh - Richardson TX, US
Adin E. Hyslop - Richardson TX, US
Assignee:
Micron Technology, Inc. - Boise ID
International Classification:
G11C 5/14
US Classification:
365227, 365201, 365226, 365228, 365229, 714 21, 714 22
Abstract:
A memory device tester capable of testing for proper operation of reduced power states in memory devices. The memory device tester can include a processor or a state machine, each configured to send commands to the memory device, and to compare results. An example of a memory device that can be tested by the memory device tester is a Direct Rambus Dynamic Random Access Memory (DRDRAM). The described processing systems and other circuits can test a DRDRAM for proper operation in a standby (STBY) state. When the DRDRAM is in STBY, the column decoder is shut off to conserve power, and the DRDRAM should not respond to column packets on the column control bus. The method and apparatus provide for testing that the column decoder is shut off when in STBY with no banks active, which is the recommended usage pattern for the part.

Determining A Read Apparent Voltage Infector Page And Infected Page

US Patent:
2020011, Apr 16, 2020
Filed:
Oct 11, 2018
Appl. No.:
16/157597
Inventors:
- Armonk NY, US
Aaron D. Fry - Richmond TX, US
Van Huynh - Houston TX, US
Charles A. Keller - Houston TX, US
Jason Szecheong Ma - Sugar Land TX, US
Kevin E. Sallese - Fushear TX, US
Adalberto G. Yanes - Sugar Land TX, US
International Classification:
G06F 3/06
G11C 16/34
G11C 16/26
G06F 11/10
Abstract:
Read Apparent Voltage (RAV) is an anomality in which an apparent threshold voltage of a storage cell transistor does not equal the actual threshold voltage of that same transistor by a large enough magnitude that the binary state of transistor is not read correctly. An infector page may cause the RAV anomality within a different infected page. To determine whether any page is an infector, each page is programmed, a page within each block is read, an acting infector page within an acting infector block is set, a possible infected page within a possible infected block is set, the acting infector page is read a predetermined plurality of instances, the possible infected page is read, a raw bit error rate (RBER) of the read of the possible infected page is determined, and the acting infector page is set as an actual infector page based upon the determined RBER.

Reducing Effects Of Read Array Operations Of Read Apparent Voltage

US Patent:
2020010, Apr 2, 2020
Filed:
Oct 1, 2018
Appl. No.:
16/148924
Inventors:
- Armonk NY, US
Timothy J. Fisher - Cypress TX, US
Adalberto G. Yanes - Rochester MN, US
Jason Szecheong Ma - Sugar Land TX, US
Charles A. Keller - Houston TX, US
Aaron D. Fry - Richmond TX, US
Van Huynh - Houston TX, US
Nikolaos Papandreou - Thalwil, CH
International Classification:
G06F 3/06
Abstract:
A computer-implemented method, according to one embodiment, includes: receiving a stream of data, and selecting more than one block of memory to write the stream of data to. The selected blocks of memory are in a memory that includes a plurality of blocks. Moreover, the data is written across the selected blocks of memory in parallel. The blocks of memory are also selected such that no two or more of the selected blocks of memory have an effect on a read apparent voltage of a same one of the plurality of blocks in the memory. Other systems, methods, and computer program products are described in additional embodiments.

Reducing Read Errors By Performing Mitigation Reads To Blocks Of Non-Volatile Memory

US Patent:
2019033, Nov 7, 2019
Filed:
May 2, 2018
Appl. No.:
15/969431
Inventors:
- ARMONK NY, US
TIMOTHY FISHER - HOUSTON TX, US
CHARLES A. KELLER - HOUSTON TX, US
JASON S. MA - HOUSTON TX, US
KEVIN E. SALLESE - HOUSTON TX, US
AARON D. FRY - HOUSTON TX, US
VAN HUYNH - HOUSTON TX, US
NIKOLAOS PAPANDREOU - RUESCHLIKON, CH
International Classification:
G06F 3/06
G11C 16/34
Abstract:
A data storage system includes a non-volatile memory array controlled by a controller that records a number of a plurality of like operations targeting a first block among a plurality of blocks in the non-volatile memory array. In response to the number of the plurality of like operations satisfying a threshold, the controller initiates a mitigation read request by recording an identifier of a second block in a high priority request in a mitigation data structure. The controller initiates other mitigation read requests by recording identifiers of other blocks of the non-volatile memory in low priority requests in the mitigation data structure. The controller preferentially services the high priority request from the mitigation data structure over the low priority requests, where servicing the high priority request includes performing a mitigation read to the second block.

Public records

Vehicle Records

Van Huynh

Address:
10507 Juniper Gln Dr, Houston, TX 77041
VIN:
JTMZD31V986057555
Make:
TOYOTA
Model:
RAV4
Year:
2008

Van Huynh

Address:
10110 Sagecanyon Dr, Houston, TX 77089
Phone:
(713) 740-7200
VIN:
4T1BK46K67U525372
Make:
TOYOTA
Model:
CAMRY
Year:
2007

Van Huynh

Address:
7400 Bissonnet St APT 1415-1, Houston, TX 77074
Phone:
(713) 777-5447
VIN:
1HGCM56437A003120
Make:
HONDA
Model:
ACCORD
Year:
2007

Van Huynh

Address:
11943 Kleinmeadow Dr, Houston, TX 77066
VIN:
2HGFG116X7H540414
Make:
HONDA
Model:
CIVIC
Year:
2007

Possible Relatives

Cynthia T Huynh  Derek H Huynh  Dave H Huynh  Diana Huynh  Dianna H Huynh  Diem T Huynh  Dong H Huynh  Van S White  Van Jones  Van F Steiner 

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