William Pong resumes & CV records
Resumes
William Pong94 Polani St #30T, Waipahu, HI 96797
William Pong Phones & Addresses
94 Polani St #30T, Waipahu, HI 96797 (808) 671-3515
94-1410 Polani St APT T, Waipahu, HI 96797
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Publications & IP owners
Us Patents
Method Of Soft X-Ray Imaging
US Patent:
5987092, Nov 16, 1999
Filed:
Mar 11, 1998
Appl. No.:
9/038806
Inventors:
William Pong - Honolulu HI
Assignee:
University of Hawaii - HI
International Classification:
G03H 500
US Classification:
378 36
Abstract:
A method for inspecting masks used in x-ray lithography is described. An x-ray lithography mask is placed over a glass surface, followed by exposure of the mask and glass surface to soft x-rays. Portions of the mask absorb the soft x-rays while other portions of the mask, corresponding to circuit elements, allow the soft x-rays to strike the glass surface. The soft x-rays striking the glass surface cause the glass surface to darken, thereby forming an image of the circuit pattern in the glass surface corresponding to the stenciled circuit in the mask. An inspection of the image can reveal any defects in the x-ray lithography mask.
Method Of Soft X-Ray Imaging
US Patent:
5778042, Jul 7, 1998
Filed:
Jul 18, 1996
Appl. No.:
8/690189
Inventors:
William Pong - Honolulu HI
Assignee:
University of Hawaii - Honolulu HI
International Classification:
G01B 1506
US Classification:
378 58
Abstract:
A method for inspecting masks used in x-ray lithography is described. An x-ray lithography mask is placed over a glass surface, followed by exposure of the mask and glass surface to soft x-rays. Portions of the mask absorb the soft x-rays while other portions of the mask, corresponding to circuit elements, allow the soft x-rays to strike the glass surface. The soft x-rays striking the glass surface cause the glass surface to darken, thereby forming an image of the circuit pattern in the glass surface corresponding to the stenciled circuit in the mask. An inspection of the image can reveal any defects in the x-ray lithography mask.
Fiber-Optic Stylet For Needle Tip Localization
US Patent:
4566438, Jan 28, 1986
Filed:
Oct 5, 1984
Appl. No.:
6/658312
Inventors:
Grover J. Liese - Honolulu HI
William Pong - Honolulu HI
William Pong - Honolulu HI
International Classification:
A61B 106
US Classification:
128 6
Abstract:
A fiber-optic stylet is provided for use with a surgical or diagnostic type needle. The stylet comprises an elongated flexible or rigid casing which is adapted to be inserted into the body of a human or animal. It also includes at least one transmitting light fiber having a bevelled end which extends to a first end of the casing and that conforms to that of the needle. A second, receiving light fiber has a bevelled end and is also positioned within the casing, also having its bevelled end located at the first end of the needle. The second fiber-optic element is generally cylindrical and has a reflective surface thereon which is located adjacent to the bevelled end of the light fiber. The apparatus is used to precisely determine the area in which a needle is positioned within a body during a diagnostic or surgical procedure.
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