Jon V Hokanson, Age 69Napavine, WA

Jon Hokanson Phones & Addresses

Chehalis, WA

1006 118Th St NE, Marysville, WA 98271

Tulalip, WA

Bothell, WA

22512 14Th St, Sammamish, WA 98074

Redmond, WA

Issaquah, WA

Snohomish, WA

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Work

Company: Lewis, Brisbois, Bisgaard & Smith LLP Address:

Mentions for Jon V Hokanson

Career records & work history

Lawyers & Attorneys

Jon Hokanson Photo 1

Jon Hokanson - Lawyer

Office:
Lewis, Brisbois, Bisgaard & Smith LLP
Specialties:
Litigation, Intellectual Property, Architects & Engineers, Sustainable Development
ISLN:
906424207
Admitted:
1980
University:
Albion College, B.A., 1970; Albion College, B.A., 1970; University of Michigan, M.S., 1976
Law School:
George Washington University Law School, J.D., 1979

Medicine Doctors

Jon S. Hokanson

Specialties:
Emergency Medicine
Work:
Emergency Care Consultants
800 E 28 St, Minneapolis, MN 55407
(612) 863-4233 (phone) (612) 863-5247 (fax)
Education:
Medical School
University of Minnesota Medical School at Minneapolis
Graduated: 2002
Languages:
English
Description:
Dr. Hokanson graduated from the University of Minnesota Medical School at Minneapolis in 2002. He works in Minneapolis, MN and specializes in Emergency Medicine. Dr. Hokanson is affiliated with Abbott Northwestern Hospital and United Hospital.

Jon Hokanson resumes & CV records

Resumes

Jon Hokanson Photo 17

Jon Hokanson

Location:
Marysville, WA
Industry:
Mechanical Or Industrial Engineering
Jon Hokanson Photo 18

Chief Technology Officer

Location:
Marysville, WA
Industry:
Mechanical Or Industrial Engineering
Work:
Mettler Toledo Autochem 2003 - 2016
Technical Consultant
Blaze Metrics 2003 - 2016
Chief Technology Officer
Mettler-Toledo Autochem 2001 - 2003
Chief Technical Officer
Lasentec 1995 - 2001
Vice President of Engineering
Laser Sensor Technology 1987 - 1995
Technical Manager
Skills:
Engineering, Manufacturing, R&D, Product Development, Testing, Supply Chain Management, Instrumentation, Process Improvement, Electronics, Project Management, Process Engineering, Management, Troubleshooting, Six Sigma, Business Process Improvement, Integration, Research and Development

Publications & IP owners

Us Patents

Method And Apparatus For Determining The Moisture Content Of Particulate Material That May Contain An Unknown Amount Of Moisture In A Frozen State

US Patent:
4354244, Oct 12, 1982
Filed:
Feb 25, 1980
Appl. No.:
6/124339
Inventors:
Christopher S. Miller - Seattle WA
Daniel F. Pope - Issaquah WA
Jon V. Hokanson - Everett WA
Assignee:
Eur-Control M&D, U.S.A., Inc. - Bellevue WA
International Classification:
G06G 758
US Classification:
364556
Abstract:
A sample box is provided for selectively receiving, retaining and discharging samples of particulate material during a plurality of successive measurement cycles. A data processor receives a plurality of input signals representing the measured weight of the sample box and the measured temperature, conductivity, and moisture (based on electrical impedance) of each sample. Using supplier-related data stored in a memory and entered through a keyboard and display, the data processor determines, for each sample, its wet bulk density, its electronic oven dry percentage from the moisture based on electrical impedance, and its density oven dry percentage from the wet bulk density. From the density and electronic oven dry percentages and the temperature of the sample, the data processor determines if the sample contains frozen moisture and also determines if the electronic and density oven dry percentages are based on valid input data. If both oven dry percentages are based on valid input data and if the sample does not contain frozen moisture, the data processor selects an average of the density and electronic oven dry percentages as a verified oven dry percentage. If both oven dry percentages are valid and frozen moisture is detected, the data processor determines a degree of frozenness factor for the sample from the density and electronic oven dry percentages, and selects a quantity equal to the density oven dry percentage, modified by the degree of frozenness, factor as the verified oven dry percentage.

System For Acquiring An Image Of A Multi-Phase Fluid By Measuring Backscattered Light

US Patent:
5815264, Sep 29, 1998
Filed:
Apr 7, 1997
Appl. No.:
8/835188
Inventors:
Barry W. Reed - Auburn WA
Jon V. Hokanson - Redmond WA
Oliver S. Hamann - Redmond WA
Thomas W. Montague - Redmond WA
Assignee:
Laser Sensor Technology, Inc - Redmond WA
International Classification:
G01N 2149
US Classification:
356336
Abstract:
An in-situ imaging system suitable for analyzing particles or droplets contained in process reactor vessels or pipelines at full process concentrations is disclosed. The system includes a light source capable of high peak power output operated in a pulsed mode that is located inside of a probe. The light from the light source is coupled into an optical fiber. The light is carried by the optical fiber to a lens system near the end of the probe which focuses the light through a window to the area which coincides with the field of view in the focal plane of the imaging optics. The imaging optics collect the light which is back-scattered from particles or droplets, magnifying the image and projecting it onto an image detector such as a CCD array.

Apparatus And Method For Particle Analysis

US Patent:
5426501, Jun 20, 1995
Filed:
Jan 6, 1993
Appl. No.:
8/001382
Inventors:
Jon V. Hokanson - Redmond WA
Barry W. Reed - Auburn WA
Assignee:
Laser Sensor Technology, Inc. - Redmond WA
International Classification:
G01N 1502
US Classification:
356335
Abstract:
Apparatus and a method are disclosed for determining the sizes of particles entrained in a fluid over a relatively wide range of sizes and determining the distribution of particles in a plurality of size increments. A sample of particles is fed into a drop tube, allowing the particles to be distributed at a relatively low density and fall through a sensing region defined at an intermediate point in the drop tube. A laser diode produces coherent light that is focused with a lens, forming a sheet of coherent light that is directed transversely through transparent sides of the drop tube toward a lens that focuses the sheet of coherent light on a photodetector. A laser intensity control circuit maintains a constant light intensity output from the laser diode when no particle is present in the sensing region and compensates for ambient light. When a particle in the size range of 32. mu. to 4000. mu. falls through the sensing region, a chord around the particle is illuminated by the relatively thin sheet of coherent light, and the level of an electrical signal produced by photodetector is reduced in direct proportion to the portion of the sheet of coherent light that is occluded by the particle.

System For Acquiring An Image Of A Multi-Phase Fluid By Measuring Backscattered Light

US Patent:
5619043, Apr 8, 1997
Filed:
Sep 21, 1994
Appl. No.:
8/310630
Inventors:
Ekhard Preikschat - Bellevue WA
Jon V. Hokanson - Redmond WA
Barry W. Reed - Auburn WA
Assignee:
Laser Sensor Technology, Inc. - Redmond WA
International Classification:
G01N 2149
US Classification:
250574
Abstract:
The present invention describes an optical technique for analyzing undiluted, multi-phase fluid flows as typically encountered inside reactor vessels or flow lines in the chemical industries. In particular the technique uses a pulsed, coherent light source and measures the back-scattered light collected over a wide scattering angle. A light beam is relayed via a set of lenses down a long probe tube, through a window at a probe tip to illuminate the material that is passing past the window. The light beam is pulsed to "freeze" the motion of the particles streaming past the window. The backscattered light is collected by the same set of optics and is focused on the front surface of a CCD chip. The lens closest to the front window has a short focal length with a large numerical aperture to collect the back-scattered light over a wide range of backward angles, thereby increasing the detection sensitivity to larger particles, which lie behind and are partially obscured by the myriad of smaller particles closest to the window. The probe tube is inserted through an insertion assembly so that the front viewing window is in direct contact with the material flow, and can be positioned so that the flow will provide a continuous and representative stream of material past the window.

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