John C Moulder DeceasedBoulder, CO

John Moulder Phones & Addresses

Boulder, CO

Ames, IA

West Des Moines, IA

Mentions for John C Moulder

John Moulder resumes & CV records

Resumes

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John Moulder

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John Moulder

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John Moulder

Work:
Us Forest Service
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John Moulder

Publications & IP owners

Wikipedia

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John Moulder Brown

John Moulder-Brown (London, June 3, 1953) is a British actor who started his career as a child; he is best remembered for his role in the 1971 classic Deep End.
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John Moulder Wils

John Moulder Wilson (October 8, 1837February 1, 1919) was a Union Army engineer and later served as Chief of Engineers as well as serving as Superintendent of

Us Patents

Method And Apparatus For Determining Thermal Resistance And Structural Integrity Of Coatings On Conducting Materials By Monitoring Electrical Conductance Of The Underlying Material Upon Localized Heating Of The Overlying Coating

US Patent:
5015950, May 14, 1991
Filed:
Jul 21, 1989
Appl. No.:
7/383799
Inventors:
James H. Rose - Ames IA
John C. Moulder - Ames IA
Assignee:
Iowa State University Research Foundation, Inc. - Ames IA
International Classification:
G01N 2772
G01R 3300
G01R 3100
US Classification:
324224
Abstract:
A system for nondestructive analysis of barrier coatings on electrically conductive materials includes imposition of a controlled known heat load to a localized area of the coating and measuring electrical conductivity of the underlying material at or near the localized area of the coating. The electrical conductivity of the material is affected by changes in temperature related to thermal conduction into the material through the coating. Thermal resistance of the coating and defects between the coating and the material can therefore be detected.

Method And Apparatus For Photoinductive Imaging

US Patent:
4950990, Aug 21, 1990
Filed:
Jul 21, 1989
Appl. No.:
7/383801
Inventors:
John C. Moulder - Ames IA
James H. Rose - Ames IA
Donald O. Thompson - Ames IA
Assignee:
Iowa State University Research Foundation, Inc. - Ames IA
International Classification:
G01R 3500
G01R 3100
G01N 2714
G01N 2720
US Classification:
324224
Abstract:
A system for photoinductive imaging for flaw detection of materials and for calibrating eddy-current probes includes positioning an eddy-current probe adjacent to a specimen to be analyzed or to be used as a calibration fixture. A source of thermal energy is modulated and focused to a localized area on the specimen. Thermal energy is then scanned across at least a portion of the detection area of the eddy-probe. The resulting signal from the eddy-current probe is recorded and can depict either thermal-influenced components of the specimen or the response pattern of the eddy-current probe. The record can therefore be used to image flaws or physical holes or shapes of the specimen or calibrate the eddy-current probe.

Pulsed Eddy Current Inspections And The Calibration And Display Of Inspection Results

US Patent:
6037768, Mar 14, 2000
Filed:
Apr 2, 1997
Appl. No.:
8/832415
Inventors:
John C. Moulder - West Des Moines IA
Sunil K. Shaligram - Dallas TX
Jay A. Bieber - Ames IA
James H. Rose - Ames IA
Assignee:
Iowa State University Research Foundation, Inc. - Ames IA
International Classification:
G01R 3312
G01N 2782
US Classification:
324225
Abstract:
A pulsed eddy current (PEC) instrument acquires PEC pulse responses from different locations on a structure being inspected. The difference between the acquired PEC pulse responses and a reference PEC response is determined to obtain time-domain difference signals having a time value and a magnitude value. The time and magnitude values are stored in memory with location information. An image display is provided that is determined from the stored magnitude values, although magnitude values for difference signals whose time values do not meet a defined time condition are filtered from the display. The time condition filters from the display known conditions such as the presence of fasteners, the presence of air-gaps between layers of the structure, and excessive PEC probe lift-off from the structure and filters the display so that only information from a particular layer or depth of the inspected structure is displayed. A quantified flaw measure can be determined by comparing the magnitude value to a calibration curve associated with a particular depth or layer of the structure. Also, Fourier transforms can be performed on the time-domain difference signal to obtain magnitude values at a multitude of frequencies which can be displayed in various formats, including an image display using a frequency condition for filtering.

Calibrating An Eddy-Current-Probe Using A Modulated Thermal Energy Source

US Patent:
5019775, May 28, 1991
Filed:
Apr 17, 1990
Appl. No.:
7/510112
Inventors:
John C. Moulder - Ames IA
James H. Rose - Ames IA
Assignee:
Iowa State University Research Foundation, Inc. - Ames IA
International Classification:
G01R 3500
US Classification:
324202
Abstract:
A system for photoinductive imaging for flaw detection of materials and for calibrating eddy-current probes includes positioning an eddy-current probe adjacent to a specimen to be analyzed or to be used as a calibration fixture. A source of thermal energy is modulated and focused to a localized area on the specimen. Thermal energy is then scanned across at least a portion of the detection area of the eddy-probe. The resulting signal from the eddy-current probe is recorded and can depict either thermal-influenced components of the specimen or the response pattern of the eddy-current probe. The record can therefore be used to image flaws or physical holes or shapes of the specimen or calibrate the eddy-current probe.

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